|ADDENDUM No. 7 to JESD24 - COMMUTATING DIODE SAFE OPERATING AREA TEST PROCEDURE FOR MEASURING dv/dt DURING REVERSE RECOVERY OF POWER TRANSISTORS:Status: Reaffirmed October 2002||JESD24- 7||Aug 1982|
Defines methods for verifying the diode recovery stress capability of power transistors.
|MULTI-WIRE MULTI-LEVEL I/O STANDARD||JESD247||Jun 2016|
This standard defines the DC and AC operating conditions, I/O impedances, termination characteristics, and compliance test methods of I/O drivers and receivers used in multi-wire, multi-level signaling interfaces. The multi-wire interfaces defined by this specification all utilize quaternary signal levels. Item 153.00