Global Standards for the Microelectronics Industry
Standards & Documents Search
Click a term to initiate a search.
Document Types
- Annex (Annexes for JESD21-C) (1) Apply Annex (Annexes for JESD21-C) filter
- CO- (Carrier Outlines) (41) Apply CO- (Carrier Outlines) filter
- CS- (Carrier Standards) (8) Apply CS- (Carrier Standards) filter
- DG- (Design Guideline) (16) Apply DG- (Design Guideline) filter
- DIMM (DIMM Index Page) (1) Apply DIMM (DIMM Index Page) filter
- DIMM-LABEL (4.19 DIMM Label) (5) Apply DIMM-LABEL (4.19 DIMM Label) filter
- DO- (Diode Outlines) (19) Apply DO- (Diode Outlines) filter
- DR- (Design Registration) (7) Apply DR- (Design Registration) filter
- DRAM (3.9 Dynamic Random Access Memory) (6) Apply DRAM (3.9 Dynamic Random Access Memory) filter
- EEPROM (3.5 Electrically Erasable Programmable Read Only Memory) (4) Apply EEPROM (3.5 Electrically Erasable Programmable Read Only Memory) filter
- EIA (EIA Standards) (10) Apply EIA (EIA Standards) filter
- EPROM (3.4 Erasable Programmable Read Only Memory) (3) Apply EPROM (3.4 Erasable Programmable Read Only Memory) filter
- GS- (Gauge Standards) (10) Apply GS- (Gauge Standards) filter
- IPC/JEDEC (Joint IPC/JEDEC Standard) (1) Apply IPC/JEDEC (Joint IPC/JEDEC Standard) filter
- J-STD- (Joint IPC/JEDEC Standards) (8) Apply J-STD- (Joint IPC/JEDEC Standards) filter
- JEB (JEDEC Engineering Bulletins) (8) Apply JEB (JEDEC Engineering Bulletins) filter
- JEP (JEDEC Publications) (123) Apply JEP (JEDEC Publications) filter
- JES (JEDEC Specifications) (1) Apply JES (JEDEC Specifications) filter
- JESD (JEDEC Standards) (441) Apply JESD (JEDEC Standards) filter
- JIG (Joint Industry Guide) (2) Apply JIG (Joint Industry Guide) filter
- JM (JEDEC Manual) (7) Apply JM (JEDEC Manual) filter
- JP (Joint Publication) (1) Apply JP (Joint Publication) filter
- JS (Joint Standard) (6) Apply JS (Joint Standard) filter
- JTR (Joint Standard) (1) Apply JTR (Joint Standard) filter
- MCP (3.12 Multi Chip Packages) (4) Apply MCP (3.12 Multi Chip Packages) filter
- MO- (Microelectronic Outlines) (357) Apply MO- (Microelectronic Outlines) filter
- MODULE (4, 4.2, 4.3, 4.4, 4.5, 4.6, 4.7 Modules) (119) Apply MODULE (4, 4.2, 4.3, 4.4, 4.5, 4.6, 4.7 Modules) filter
- MPDRAM (3.10 Multiport Dynamic Random Access Memory) (5) Apply MPDRAM (3.10 Multiport Dynamic Random Access Memory) filter
- MS- (Microelectronic Standards) (34) Apply MS- (Microelectronic Standards) filter
- NVRAM (3.6 Nonvolatile Random Access Memory) (2) Apply NVRAM (3.6 Nonvolatile Random Access Memory) filter
- PR (Preliminary Release for JESD21-C) (8) Apply PR (Preliminary Release for JESD21-C) filter
- PROM (3.3 Programmable Read Only Memory) (3) Apply PROM (3.3 Programmable Read Only Memory) filter
- PS- (Performance Standards) (7) Apply PS- (Performance Standards) filter
- PSRAM (3.8 Pseudostatic Random Access Memory) (1) Apply PSRAM (3.8 Pseudostatic Random Access Memory) filter
- RDF (Registration Data Format) (1) Apply RDF (Registration Data Format) filter
- ROM (3.2 Read Only Memory) (2) Apply ROM (3.2 Read Only Memory) filter
- SDRAM (3.11 Synchronous Dynamic Random Access Memory) (16) Apply SDRAM (3.11 Synchronous Dynamic Random Access Memory) filter
- SO- (Socket Outlines) (31) Apply SO- (Socket Outlines) filter
- SPD (4.1.2 Serial Presence Detect) (26) Apply SPD (4.1.2 Serial Presence Detect) filter
- SPP- (Standard Practices and Procedures) (25) Apply SPP- (Standard Practices and Procedures) filter
- SRAM (3.7 Static Random Access Memory) (11) Apply SRAM (3.7 Static Random Access Memory) filter
- TENTSTD (Tentative Standards) (4) Apply TENTSTD (Tentative Standards) filter
- TO- (Transistor Outlines) (55) Apply TO- (Transistor Outlines) filter
- TS- (Transistor Standards) (5) Apply TS- (Transistor Standards) filter
- UO- (Uncased Outlines) (2) Apply UO- (Uncased Outlines) filter
- US- (Uncased Standards) (1) Apply US- (Uncased Standards) filter
