Gate Dielectric Breakdown

JESD263

Published: Mar 2024

This document describes procedures developed for estimating the overall integrity of gate dielectrics.

JESD263 supersedes these other 4 standards: JESD35A, JESD35-1 ADDENDUM, JESD35-2 and JESD92.

Committee(s): JC-14, JC-14.2

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