Global Standards for the Microelectronics Industry
METHODS FOR CALCULATING FAILURE RATES IN UNITS OF FITS
JESD85A
Published: Jul 2021
This standard establishes methods for calculating failure rates in units of FITs by using data in varying degrees of detail such that results can be obtained from almost any data set. The objective is to provide a reference to the way failure rates are calculated.
Committee(s): JC-14.3
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