Global Standards for the Microelectronics Industry
IC LATCH-UP TEST
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined latch-up stress.
This standard has been adopted by the Defense Logistics Agency (DLA) as project 5962-1880.
Committee(s): JC-14, JC-14.1