FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING

JESD659C

Published: Apr 2017

This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD659 after revision, September 1999.

Committee(s): JC-14, JC-14.3

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