STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

JESD47J.01

Published: Sep 2017

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

This is a minor editorial revision to JESD47J to correct the equation in 7.1.1, for details see Annex B.

Committee(s): JC-14.3

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