ADDENDUM No. 9 to JESD24 - SHORT CIRCUIT WITHSTAND TIME TEST METHOD:

JESD24- 9

Published: Aug 1992

Status: Reaffirmed> October 2002

Test method to determine how long a device can survive a short circuit condition with a given drive level.

Committee(s): JC-25

Free download. Registration or login required.

Document Information

Standards & Documents Assistance:

Published JEDEC documents on this website are self-service and searchable directly from the homepage by keyword or document number.

Click here for website or account help.

To report potential errors or make suggestions for improvement to a published JEDEC standard, please use this form. JEDEC does not accept requests for implementation assistance or interpretation of documents. For other inquiries related to standards & documents email Angie Steigleman.