FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS

JESD22-C101F

Published: Oct 2013

Status: Rescinded> February 2020

The material in this test method has been supeceded by JS-002-2018, published January 2019

Committee(s): JC-14, JC-14.1