Global Standards for the Microelectronics Industry
Guidelines for Gate Charge (QG) Test Method for SiC MOSFET
JEP192
Published: Jan 2023
This publication defines a QGS, TOT, QGD and QGS, TH which can be extracted from a measured QG waveform for SiC MOSFETs.
Committee(s): JC-70, JC-70.2
Free download. Registration or login required.