Global Standards for the Microelectronics Industry
Guidelines for Measuring the Threshold Voltage (VT) of SiC MOSFETs
JEP183A
Published: Jan 2023
This publication describes the guidelines for VT measurement methods and conditioning prior to VT testing in SiC power MOSFETs to reduce or eliminate the effect of the aforementioned hysteresis.
A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office.
Committee(s): JC-70.1
Free download. Registration or login required.