UNDERSTANDING ELECTRICAL OVERSTRESS - EOS

JEP174

Published: Sep 2016

This purpose of this white paper will be to introduce a new perspective about EOS to the electronics industry. As failures exhibiting EOS damage are commonly experienced in the industry, and these severe overstress events are a factor in the damage of many products, the intent of the white paper is to clarify what EOS really is and how it can be mitigated once it is properly comprehended.

Committee(s): JC-14.3

Free download. Registration or required.