DYNAMIC ON-RESISTANCE TEST METHOD GUIDELINES FOR GaN HEMT BASED POWER CONVERSION DEVICES, VERSION 1.0

JEP173

Published: Jan 2019

Status: Reaffirmed> November 2024

This document is intended for use in the GaN power semiconductor and related power electronic industries, and provides guidelines for measuring the dynamic ON-resistance of GaN power devices.

Reaffirmed: November 2024

Committee(s): JC-70, JC-70.1

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