Global Standards for the Microelectronics Industry
DYNAMIC ON-RESISTANCE TEST METHOD GUIDELINES FOR GaN HEMT BASED POWER CONVERSION DEVICES, VERSION 1.0
JEP173
Published: Jan 2019
Status: Reaffirmed> November 2024
This document is intended for use in the GaN power semiconductor and related power electronic industries, and provides guidelines for measuring the dynamic ON-resistance of GaN power devices.
Reaffirmed: November 2024
Committee(s): JC-70, JC-70.1
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