METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS:

JEB5-A

Published: Jan 1970

Status: Reaffirmed> February 1984

The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information. Both static and dynamic measurements are covered.

Committee(s): JC-BOD

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