Global Standards for the Microelectronics Industry
test function (TF)
On a memory, the input that, when true, causes built-in on-chip test logic to be actuated and the part to go into its test mode of operation.
References:
JESD21-C, 1/97
On a memory, the input that, when true, causes built-in on-chip test logic to be actuated and the part to go into its test mode of operation.
JESD21-C, 1/97
