Global Standards for the Microelectronics Industry
single-event latch-up (SEL)
An abnormal high-current state in a device caused by the passage of a single energetic particle through sensitive regions of the device structure and resulting in the loss of device functionality.
NOTE 1 SEL may cause permanent damage to the device. If the device is not permanently damaged, power cycling of the device (off and back on) is necessary to restore normal operation.
NOTE 2 An example of SEL in a CMOS device occurs when the passage of a single particle induces the creation of parasitic bipolar (p-n-p-n) shorting of power to ground.