single-event hard error (SEH: SHE)

An irreversible change in operation resulting from a single radiation event and typically associated with permanent damage to one or more elements of a device (e.g., gate oxide rupture).

References: 

JESD57#, 12/96
JESD89-1, 6/04
JESD89-2, 11/04
JESD89-3, 9/05