single-event effect (SEE)

Any measurable or observable change in state or performance of a microelectronic device, component, subsystem, or system (digital or analog) resulting from a single energetic-particle strike.

NOTE Single-event effects include single-event upset (SEU), multiple-bit upset (MBU), multiple-cell upset (MCU), single-event functional interrupt (SEFI), single-event latch-up (SEL), single-event hard error (SHE), and single-event transient (SET), single-event burnout (SEB), and single-event gate rupture (SEGR).

References: 

JEP133B, 3/05
JESD57#, 12/96
JESD89A, 10/06