Global Standards for the Microelectronics Industry
signature (of a failure)
The necessary and sufficient information about a failure that establishes a strong relationship between failure characteristics and failure mechanism. This necessary and sufficient information can include emission microscopy results, morphology data, test data, IV-curves, environmental history, etc. and therefore can be either electrical or physical in nature. The scope of application can be time-based, lot-based, package-based, design-based, etc.