Global Standards for the Microelectronics Industry
Dictionary V
valid time (general)
The time interval during which a signal is (or should be) valid.
References:JESD100-B, 12/99
valid time, output data-
The time interval during which output data continues to be valid following a change of input conditions that could cause the output data to change at the end of the interval.
References:JESD100-B, 12/99
validation
The process of confirming the verification process under use conditions.
References:JEP148, 4/04
valley point (1) (of a programmable unijunction transistor characteristic)
The point on the current-voltage characteristic corresponding to the second lowest current at which dvAK/diA = 0 when the gate is biased from a resistive voltage divider.
(2) (of a unijunction transistor characteristic): The point on the emitter current-voltage characteristic corresponding to the second lowest current at which dvEB1/diE = 0.
References:JESD77-B, 2/00
JESD77-B, 2/00
varactor diode
A two-terminal semiconductor device in which use is made of the property that its capacitance varies with the applied voltage.
Graphic symbols (ref. IEEE Std 315):
JESD77-B, 2/00
variables data
A measure of a characteristic for which every value within a given interval is possible.
References:EIA-557-A, 7/95
JESD659B, 2/07
variance components analysis
A design-of-experiments (DOE) method of estimating the magnitude and contribution of each investigated source of variability to the total.
References:JEP132, 7/98
variation
The difference among individual outputs of a process. The sources of variation can be grouped into two major classes: common causes and special causes.
References:EIA-557-A, 7/95
varistor
A transient voltage suppressor that is a two-terminal semiconductor device having a nonlinear voltage-current characteristic.
Graphic symbols (ref. IEEE Std 315):
JESD77-B, 2/00
VCC
See "logic power voltage".
References:VCCQ
See "output stage logic power voltage".
References:VDD
See "drain power voltage".
References:VDDQ
See "output stage drain power voltage".
References:VEE
See "emitter power voltage".
References:verification
The process of confirming that the specified requirements are fulfilled, excluding reliability requirements.
References:JEP148, 4/04
verify
To interrogate the internal configuration contents of a programmable logic device (PLD) to confirm that it has been correctly programmed by comparing the data in the device to that in an external file containing the desired configuration. Similar to reading except that the contents of the PLD are not transferred to the programming system.
References:JESD32, 6/96
vertical field-effect transistor (VFET)
A field-effect transistor in which the current between the drain and source electrodes is primarily normal to the top surface of the die.
NOTE If the device has an MOS structure, the usual abbreviation is "VMOS".
References:JESD24, 7/85
JESD77-B#, 2/00
vertical surface-mount package
A surface-mount package that is intended to be mounted perpendicular to the seating plane.
NOTE The package may include supporting posts (for insertion through the seating surface) or pedestals (for attachment to the seating surface).
References:JESD30D, 7/06
VFET
See "vertical field-effect transistor".
References:VHH
See "special function enable voltage".
References: