Global Standards for the Microelectronics Industry
Dictionary U
used gate (in a gate array)
A single gate equivalent that has been interconnected and is employed in the functioning of the circuit.
References:JESD12-1B, 8/93
JESD99B, 5/07
useful life (of an repairable unit)
The time interval between the start of use of an unrepairable unit and its statistically expected failure in an application.
References:JEP148, 4/04
user ID
A programmable space on some devices that allows users to store nonfunctional data of any sort. It is often used to track design revision numbers or other such identifying information.
References:JESD32, 6/96
USRT
See "universal synchronous receiver transmitter".
References:UV-EPROM
See "ultraviolet-erasable programmable read-only memory".
References:UW
See "upper-byte write enable".
References:Pages
- « first
- ‹ previous
- 1
- 2
- 3