Global Standards for the Microelectronics Industry
Dictionary O
objective evidence
Information that can be verified, based on factors obtained through observation, measurement, test, or other means.
References:EIA-599-A, 6/98
observability
The ability to determine the logic state(s) of a node at the circuit's externally accessible node(s).
References:JESD12-5, 8/88
observed failure rate (λo)
The failure rate determined from a product or test vehicle subjected to an accelerating stress that may produce failures attributable to one or more failure mechanisms. References: JEP122E, 3/09JEP143B.01, 6/08
octave
The interval between two frequencies that have a ratio of 2 to 1. NOTE The number of octaves, N, between two frequencies, f1 and f2, is given by N =
References:log (f2/f1)
OE(n)
See "output enable".
References:off impedance (of a thyristor)
The small-signal impedance between the terminals through which the principal current flows when the thyristor is in the off state. (Ref. EIA‑397.)
References:JESD77-B, 2/00
off state (1) (of a thyristor)
The state of a thyristor, in a quadrant in which switching can occur, that corresponds to the portion of the characteristic between the origin and the breakover point.
(2) (of a thyristor surge protective device): The state of a thyristor surge protective device, in a quadrant in which switching can occur, that corresponds to the high dynamic-resistance portion of the characteristic between the origin and the beginning of the breakdown region.
References:JESD77-B, 2/00
JESD77-B, 2/00
off-state current (Ioff)
The current into a circuit node when the device or a portion of the device affecting that circuit node is in the off state.
NOTE When additional subscripts are used, the off-state current is identified by "off" in parentheses following the additional subscripts, e.g., IO(off) for off-state output current.
References:JESD99B, 5/07
offset error (of a linear analog-to-digital converter [digital-to-analog converter]) (EO)
The difference between the actual midstep [step] value and the nominal midstep [step] value at the offset point.
NOTE See notes 1, 2, and 3 under "gain error".
References:JESD99B, 5/07
offset point (of an adjustable analog-to-digital converter [digital-to-analog converter])
The point in the transfer diagram corresponding to the midstep [step] value of the step about which the transfer diagram rotates when the gain is adjusted.
NOTE Offset adjustment must be performed with respect to this point so that it causes only a parallel displacement of the transfer curve.
References:JESD99B, 5/07
ohmic region
The region of the drain voltage-current characteristic curve in which a change in drain-source voltage causes a proportional change in drain current.
References:JESD24, 7/85
JESD77-B, 2/00
on impedance (of a thyristor)
The small-signal impedance between the terminals through which the principal current flows when the thyristor is in the on state. (Ref. EIA‑397.)
References:JESD77-B, 2/00
on state (of a thyristor)
The state of a thyristor, in a quadrant in which switching can occur, that corresponds to the low-resistance, low-voltage portion of the characteristic.
References:JESD77-B, 2/00
on-state drain current (ID(on))
The direct current into the drain terminal with a specified forward gate-source voltage applied to bias the device to the on-state.
References:JESD24, 7/85
on-state gate-source charge (Qg(on))
The gate charge necessary to reach a gate-source voltage that will support a minimum specified on-state drain current.
References:JESD24-2, 1/91
on-state resistance (ron)
The resistance between specified terminals with input conditions applied that, according to the product specification, will establish minimum resistance (the on-state) between those terminals.
References:JESD99B, 5/07
ongoing process analysis (OPA)
The application of signature analysis to an unknown (assumed to be infinite) population of failures collected over time from multiple lots, events, or labs.
References:JEP136, 7/99
OP
See "optional".
References:open circuit
A circuit having a terminating impedance sufficiently high that halving its magnitude does not produce a change in the parameter being measured that is greater than the required accuracy of the measurement.
References:JESD10, 9/81
JESD24, 7/85
JESD77-B, 2/00
open-circuit fault
In a circuit, a fault that alters the number of nodes by breaking a node into two or more nodes.
References:JESD12-5, 8/88
