Global Standards for the Microelectronics Industry
Dictionary K
K
(1) A thermal calibration factor equal to the reciprocal of the temperature coefficient of base-emitter voltage (αVBE).
(2) A thermal calibration factor equal to the reciprocal of the temperature coefficient of gate-emitter on-state voltage (VTC).
References:JESD24-4, 11/90
JESD24-6, 10/91
K
See "input clock".
References:K
See "kilo (as a prefix to units of semiconductor storage capacity)".
References:k
See "Boltzmann's constant".
References:K factor
The change in junction temperature divided by the change in a temperature-sensitive parameter (TSP) in the linear region of the TSP-temperature characteristic.
References:JESD51-1#, 12/95
K factor calibration
The measurement and data-reduction process that results in values of K factor for the semiconductor device under test.
References:JESD51-1, 12/95
K, k
See "cathode terminal".
References:kilo (K) (as a prefix to units of semiconductor storage capacity)
A multiplier equal to 1024 (210).
NOTE 1 Contrast with the SI prefix kilo (k) equal to 103, as in a 1‑kb/s data transfer rate, which is equal to 1000 bits per second.
NOTE 2 See note 2 to "mega (M)".
References:JESD21-C#, 1/97
JESD100-B, 12/99