Global Standards for the Microelectronics Industry
(1) A thermal calibration factor equal to the reciprocal of the temperature coefficient of base-emitter voltage (αVBE).
(2) A thermal calibration factor equal to the reciprocal of the temperature coefficient of gate-emitter on-state voltage (VTC).References:
See "input clock".References:
See "kilo (as a prefix to units of semiconductor storage capacity)".References:
See "Boltzmann's constant".References:
The change in junction temperature divided by the change in a temperature-sensitive parameter (TSP) in the linear region of the TSP-temperature characteristic.References:
K factor calibration
The measurement and data-reduction process that results in values of K factor for the semiconductor device under test.References:
See "cathode terminal".References:
kilo (K) (as a prefix to units of semiconductor storage capacity)
A multiplier equal to 1024 (210).
NOTE 1 Contrast with the SI prefix kilo (k) equal to 103, as in a 1‑kb/s data transfer rate, which is equal to 1000 bits per second.
NOTE 2 See note 2 to "mega (M)".References: