Global Standards for the Microelectronics Industry
Dictionary H
H bridge
Synonym for "full-bridge (output)".
References:H switch
Synonym for full-bridge (output).
NOTE The term "H switch" is usually applied to forward-off-reverse-switching (using one or two three-state outputs) or forward-reverse-switching applications.
References:JESD99B, 5/07
half-bridge (output)
A bipolar (three-state or totem-pole) power-driver output.
References:JESD99B, 5/07
half-duplex transmission
Data transmission in either direction, one direction at a time. (Ref. ANSI X3.172.)
References:JESD100-B, 12/99
half-period jitter (tjit(hper))
The magnitude of the deviation in time duration between half-cycle threshold crossings of a signal over a random sample of half cycles.
References:JESD65B, 9/03
half-wave rectifier circuit
A circuit that changes single-phase alternating current into pulsating unidirectional current utilizing only one half of each cycle.
References:JESD282-B, 4/00
halogen-free board
Printed board resins plus reinforcement matrix that contain maximum total halogens of 1500 ppm with less than 900 ppm bromine and less than 900 ppm chlorine (ref. IEC 61249-2-21). References: J-STD-609, 5/07handheld electronic product
An electronic product that can conveniently be stored in a pocket (of sufficient size) and operated when held in the user's hand.
NOTE Included in handheld electronic products are cameras, calculators, cell phones, pagers, palm-size PCs, Personal Computer Memory Card International Association (PCMCIA) cards, smart cards, mobile phones, personal digital assistants (PDAs), and other communication devices.
References:JESD22-B111, 7/03
JESD22-B113, 3/06
hard error
An irreversible change in operation that is typically associated with permanent damage to one or more elements of a device or circuit (e.g., gate oxide rupture, destructive latch-up events).
NOTE The error is called "hard" because the data is lost and the device or circuit no longer functions properly, even after power reset and re-initialization.
References:JESD89A, 10/06
hardware
Physical equipment, as opposed to programs, procedures, rules, and associated documentation. (Ref. ANSI X3.172.)
NOTE Contrast with "software".
References:JESD100-B, 12/99
hardware accelerator
A system that uses software-configurable hardware to speed up software models that are used to model the network being simulated.
NOTE The objective is to achieve faster simulation than can be achieved with software simulators.
References:JESD12-1B, 8/93
JESD99B, 5/07
harmonic content (of a nonsinusoidal periodic wave)
The order and magnitude of the harmonic components.
References:JESD282-B, 4/00
hazard rate
Synonym for "instantaneous failure rate".
References:heat sink; heat dissipator
A separable element or integral part of the package that aids in dissipating the heat produced within the package.
References:JESD51-1#, 12/95
JESD99B, 5/07
heating current (IH)
A current supplied to the device under test to cause the junction temperature to rise.
References:JESD51-1, 12/95
heating power (PH)
The product of heating current, IH, and heating voltage, VH; it causes the junction temperature of the device under test to rise.
References:JESD51-1, 12/95
heating pulse width (tH)
The length of time electrical power, PH, is applied to the device under test to cause the junction temperature to rise.
References:JESD24-3#, 11/90
JESD24-4#, 11/90
JESD24-6#, 10/91
JESD51-1, 12/95
heating voltage (VH)
The voltage across the device under test during the application of heating current, IH.
References:JESD51-1, 12/95
heterojunction
A region of transition between two different semiconductor materials, usually with a negligible discontinuity in the crystalline structure.
NOTE A heterojunction can be between materials of the same conductivity type (isotype heterojunction) or of the opposite conductivity type (anisotype heterojunction).
References:JESD77-B, 2/00