Dictionary E

emitter region, (physical)

(1) A region from which charge carriers that will become minority carriers in the base are injected into the base. (Ref. 60 IRE 28.S1.)

(2) The physical region that is designed by the manufacturer to contain the supply region in the normal operating mode and, in a simple discrete transistor, is externally accessible by the designated emitter terminal.

References:

JESD10, 9/81

JESD77-B, 2/00

emitter region, functional

A supply region that delivers principal-current charge carriers into a controlling base region through an associated emitting junction.

NOTE This definition applies for the actual operating mode of the device regardless of the name of any associated terminal. In the normal operating mode, this functional region is located in the emitter region; in the inverse operating mode, it is located in the collector region.

References:

JESD77-B, 2/00

emitter terminal (E, e)

The specified externally available point of connection to the emitter region.

References:

JESD77-B, 2/00

emitter-base voltage, collector open (VEBO)

The dc voltage between the emitter terminal and the base terminal with the collector terminal open-circuited.

References:

JESD10, 9/81

emitting junction

A semiconductor junction in an operating condition in which the net flow of charge carriers of each type across the junction is in the direction from the region where they are majority carriers to the region where they are minority carriers, i.e., in the direction opposite to the force resulting from the internal electric field.

References:

JESD77-B, 2/00

empty zero; real zero (in a charge-transfer device)

A condition in which there is no bias charge or low-level charge.

References:

JESD99B, 5/07

enable time (general)

The time interval between the transition of the enabling signal and the commencement of the intended operation.

References:

JESD100-B, 12/99

enable time to the high level (of a three-state or H-type open-circuit output) (tPZH)

The propagation time between specified reference points on the input and output voltage waveforms with the output changing from a high-impedance (off) state to the defined high level.

NOTE 1 See note 1 to "disable time from the high level …".

NOTE 2 Because H-type open-circuit outputs are used with pull-down components that cause the outputs to go low when the outputs are turned off, the term "low-to-high-level propagation time" and the symbol tPLH are frequently used with these outputs for this parameter.

References:

JESD99B, 5/07

enable time to the low level (of a three-state or L-type open-circuit output) (tPZL)

The propagation time between specified reference points on the input and output voltage waveforms with the output changing from a high-impedance (off) state to the defined low level.

NOTE 1 See note 1 to "disable time from the high level …".

NOTE 2 Because L-type open-circuit outputs are used with pull-up components that cause the outputs to go high when the outputs are turned off, the term "high-to-low-level propagation time" and the symbol tPHL are frequently used with these outputs for this parameter.

References:

JESD99B, 5/07

enable time, chip-enable to power-up

The time interval between the transition of the enabling signal and the instant when the supply current has increased from its standby value to its active value.

NOTE This interval is defined with respect to specified reference points on the chip-enable and supply-current waveforms.

References:

JESD100B.01, 12/02

enable time, output (of a three-state, open-collector, open-emitter, open-drain, or open-source output) (ten)

The propagation time between specified reference points on the input and output voltage waveforms with the output changing from a high-impedance (off) state to either of the defined active levels (high or low).

References:

JESD99B, 5/07
JESD100-B, 12/99

enable transition time to the high level (of a three-state or H-type open-circuit output) (tTZH)

The transition time between specified reference points on the output voltage waveform with the output changing from a high-impedance (off) state to the defined high level.

NOTE 1 See note 1 to "disable time from the high level …".

NOTE 2 Because H-type open-circuit outputs are used with pull-down components that cause the outputs to go low when the outputs are turned off, the term "low-to-high-level transition time" and the symbol tTLH are frequently used with these outputs for this parameter.

References:

JESD99B, 5/07

enable transition time to the low level (of a three-state or L-type open-circuit output) (tTZL)

The transition time between specified reference points on the output voltage waveform with the output changing from a high-impedance (off) state to the defined low level.

NOTE 1 See note 1 to "disable time from the high level …".

NOTE 2 Because L-type open-circuit outputs are used with pull-up components that cause the outputs to go high when the outputs are turned off, the term "high-to-low-level transition time" and the symbol tTHL are frequently used with these outputs for this parameter.

References:

JESD99B, 5/07

encoder

A network or system in which only one input is excited at a time and each input produces a unique combination of output signals. (Ref. ANSI/IEEE Std 100.)

References:

JESD99B, 5/07

end-product parameter

A parameter that characterizes the product (e.g., piece parts, subassemblies, and/or assemblies) at the finished product stage.

References:

EIA-599-A, 6/98

endurance (of a reprogrammable read-only memory)

The ability of a reprogrammable read-only memory to withstand data rewrites and still comply with its specifications. References:

JESD22-A117B, 3/09
JESD100-B, 12/99

endurance failure

The loss of the ability of a component, as a result of endurance cycling, to meet the electrical or physical performance specifications that (by design or testing) it was intended to meet.

References:

JESD22-A117A, 3/06

enhanced low dose rate sensitivity (ELDRS)

The characteristic of a device that exhibits an enhanced total dose response at dose rates below 50 rad(Si)/s.

References:

JEP133B, 3/05

enhancement-mode operation

The operation of a field-effect transistor such that changing the gate-source voltage from zero to a finite value increases the magnitude of the drain current. (Ref. IEC 747‑8.)

References:

JESD77-B, 2/00

enhancement-mode operation

The operation of a field-effect transistor such that changing the gate-source voltage from zero to a finite value increases the magnitude of the drain current.

References:

JESD24, 7/85

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