Global Standards for the Microelectronics Industry
Dictionary D
delay time, (digital) (of a linear or a multiplying digital-to-analog converter) (td or tdd)
The time interval between the instant when the digital input changes and the instant when the analog output passes a specified value that is close to its initial value, ignoring glitches.
NOTE For a multiplying digital-to-analog converter, the full term and the additional subscript d must be used to distinguish between the digital and the reference delay times.
References:JESD99B, 5/07
delay time, reference (of a multiplying digital-to-analog converter) (tdr)
The time interval between the instant when a step change of the reference voltage occurs and the instant when the analog output passes a specified value that is close to its initial value.
References:JESD99B, 5/07
delivery and lead time rating
An assessment of the metrics established to evaluate delivery of product.
References:JEP146#, 6/03
depletion layer, collector(-base)
Synonym for "space-charge region, collector(-base)".
References:JESD77-B, 2/00
depletion layer, emitter(-base)
Synonym for "space-charge region, emitter(-base)".
References:JESD77-B, 2/00
depletion-mode operation
The operation of a field-effect transistor such that changing the gate‑source voltage from zero to a finite value decreases the magnitude of the drain current. (Ref. IEC 747‑8.)
References:JESD24, 7/85
JESD77-B, 2/00
depletion-type field-effect transistor
A field-effect transistor having appreciable channel conductance for zero gate-source voltage; the channel conductance may be increased or decreased according to the polarity of the applied gate-source voltage. (Ref. IEC 747‑8.)
References:JESD24, 7/85
JESD77-B, 2/00
deposition
The process of applying a material to a substrate by means of vacuum, electrical, chemical, screening, or vapor methods.
References:JESD99B, 5/07
deposition, vapor-phase
The deposition of conductive, resistive, insulating, or semiconductor films onto a substrate from a source material in the vapor phase by physical deposition or chemical reaction.
References:JESD99B, 5/07
derating (thermal) (relating to reliability)
The practice of using an electronic device in a narrower environmental and/or operating envelope than its manufacturer-designated limits.
References:JEP149, 11/04
desiccant
An absorbent material used to maintain a low relative humidity.
References:J-STD-033B, 10/05
design module
A software description of a functional block describing the function and performance.
References:JESD12-1B, 8/93
JESD99B, 5/07
design of experiments (DOE)
(1) An efficient method of experimentation that identifies factors that affect the mean and variation with minimum testing.
(2) A systematic approach to varying the input-controllable variables in the process and analyzing the effects of these process variables on the outputs. When employed in conjunction with statistical process controls, it can minimize process variability.
References:JEP131A, 5/05
JEP132, 7/98
design rules
The basic rules and regulations for circuit design with electrical and geometrical parameters specified for the range of application conditions and time.
References:JEP148, 4/04
detectable fault
A functional fault for which a test pattern can be created that will always cause the effects of the fault to be observable at an externally accessible node.
References:JESD12-5, 8/88
detected fault
A functional fault that causes effects that are observed at an externally accessible node when the circuit is exercised by the existing test pattern.
References:JESD12-5, 8/88
detector diode
A diode, often associated with microwave circuits, that converts rf energy into dc or video output.
References:JESD77-B, 2/00
deviation from coplanarity
The distance between the intended contact point of a terminal and the established seating plane or regression plane.
NOTE Contrast with "deviation from planarity".
References:JESD22-B108A, 1/ 03
deviation from planarity
The difference in height between the highest point and the lowest point on the package body bottom surface measured with respect to the seating plane.
NOTE Contrast with "deviation from coplanarity".
References:JESD22-B112, 5/05
device-level description
A structural description using circuit elements as primitives.
References:JESD12-1B, 8/93
JESD99B, 5/07