Dictionary A

A bipolar (three-state or totem-pole) output whose sink-current capability significantly exceeds its source-current capability.

JESD99B, 5/07

The time it takes for the structure resistance to reach or exceed R_fail while the structure is under stress from the isothermal test algorithm.

JESD61#, 4/97

See "analog-to-digital [A/D] converter".

(1) A character or group of characters that identifies a register, a particular part of storage, or some other data source or destination. (Ref. ANSI X3.172.)

(2) To refer to a device or a data item by its address. (Ref. ANSI X3.172.)

JESD100-B, 12/99

The pins that are multiplexed three ways to serve as address input, data input, and data output pins. When the address data input/output numbering is significant for device operation, the addresses are numbered beginning with 0.

JESD21-C, 1/97

Those inputs that select (address) a particular cell or set of cells within a memory array for presentation on the device outputs. The integer (n) serves to differentiate the address inputs, one from another. When the address number is significant for device operation, the addresses are numbered beginning with 0.

JESD21-C, 1/97

An input that, when true, allows the input address to be entered into a register and, when false, causes the address state previously entered to be latched.

JESD21-C, 1/97

A register that is used to hold an address. (Ref. IEC 824.)

JESD100-B, 12/99

See "address data input/output".

A source of charged air molecules (ions).

JESD625-A, 12/99

See "address latch enable".

Synonym for "registration mark".

JESD99B, 5/07

The number of alpha particles that decay in an alpha source per unit time.

NOTE The preferred SI unit is the becquerel (Bq); to convert from the curie, multiply by 3.7 × 10¹⁰ (exactly).

JESD89-2, 11/04

See "arithmetic and logic unit".

The air temperature measured below a device, in an environment of substantially uniform temperature, cooled only by natural air convection and not materially affected by reflective and radiant surfaces.

JESD10, 9/81
JESD61#, 4/97
JESD77-B, 2/00
RS-323, 3/66

A gate whose output signal is a linear function of one or more input signals.

JESD99B, 5/07

An integrated circuit providing the analog part of an analog-to-digital converter.

NOTE Provision of external timing, counting, and arithmetic operations is necessary for implementing a full analog-to-digital converter.

JESD99B, 5/07

A converter that uniquely represents all analog input values within a specified total input range by a limited number of digital output codes, each of which exclusively represents a fractional part of the total analog input range.

NOTE This quantization procedure introduces inherent errors of ±½ LSB (least significant bit) in the representation because, within this fractional range, only one analog value can be represented free of error by a single digital output code.

JESD99B, 5/07

A statistical tool that allows for the comparison of more than two groups of data and provides valid assumptions. Computations of ANOVA involve partitioning total variation into two components: the variation from differences among group "means", and random variations within the groups known as "error". ANOVA provides for reliable results even when certain assumptions are violated.

JEP132, 7/98

(1) The p‑type region from which the forward current flows within a semiconductor diode.

NOTE    In Schottky diodes, usually the barrier metal replaces the p‑type semiconductor region and the remaining semiconductor region is n‑type; however, some Schottky diodes have been made with the barrier metal replacing the n‑type semiconductor region, in which case the remaining semiconductor region is p‑type.

(2) A circuit element to which positive bias is applied.

NOTE  For the purpose of JEP154, when the die is the anode the electron flow is the substrate through the solder bump to the die.

JESD77C, 10/09
JESD282-B, 4/00
JEP154, 1/08