Global Standards for the Microelectronics Industry
Dictionary A
A
See "port A; port B".
References:A(n)
See "address inputs".
References:A-mode
See "acoustic data, A-mode"
References:A; a
See "anode terminal".
References:ABD
See “avalanche breakdown diode”. References:ABD array
A device having three or more terminals and containing multiple diodes within a single package, with at least one of the diodes being an ABD.NOTE ABD arrays can be classified as 1) devices with multiple discrete semiconductor chips; and 2) devices with multiple diode junctions diffused into a single semiconductor chip.
References: JESD77C, 10/09JESD210, 12/07
absolute maximum rated junction temperature
The maximum junction temperature of an operating device, beyond which damage (latent or otherwise) may occur.
References:JESD22-A108C, 6/05
absolute maximum rated temperature
The maximum junction or ambient temperature of an operating device as listed in its data sheet and beyond which damage (latent or otherwise) may occur.
NOTE Manufacturers may also specify maximum case temperatures for specific packages.
References:JESD89-3, 9/05
absolute maximum rated voltage
The maximum voltage that may be applied to a device, beyond which damage (latent or otherwise) may occur.
References:JESD22-A108C, 6/05
JESD89-1, 6/04
JESD89-2, 11/04
JESD89-3, 9/05
ABTXXXXXX series
A BiCMOS series that includes devices whose input logic levels are TTL-compatible and whose outputs are specified at TTL levels.
References:JESD54, 2/96
ac controller
A circuit that produces, from an ac input, an ac output that is proportional to a control input.
References:JESD14#, 11/86
ac noise margin
The maximum transient or pulse voltage amplitude of extraneous signal that can be algebraically added to the noise-free worst-case input level without causing the output voltage to deviate from the allowable logic voltage level.
References:RS-390-A, 2/81
ac test
The process of verifying the specified timing of a device.
NOTE Testing of propagation delays, minimum setup and hold times, minimum pulse durations, etc., can be performed by using test vectors applied at the specified operating frequency of the device. Propagation delays of critical logic paths for system operation can be measured individually.
References:JESD12-1B, 8/93
JESD99B, 5/07
ac unbalanced voltage
The difference between the peak values of the ac voltages at the two outputs when the circuit is operating in the maximum-output-voltage-swing condition.
References:JESD99B, 5/07
accelerated soft error rate (ASER)
An error rate obtained in the presence of an ionizing radiation source.
References:JESD89, 8/01
