Recently Published Documents

Title Document # Date Details
SPD Annex L: Serial Presence Detect (SPD) for DDR4 SDRAM Modules, Release 5

This annex describes the serial presence detect (SPD) values for all DDR4 modules covered in Document Release 5. Differences between module types are encapsulated in subsections of this annex. These presence detect values are those referenced in the SPD standard document for ‘Specific Features’. Item 2276.05.

SPD4.1.2.L-5 Aug 2019 view
260-Pin, 1.2 V (VDD), PC4-1600/PC4-1866/PC4-2133/PC4-2400/PC4-2666/PC4-3200 DDR4 SDRAM SODIMM Design Specification

This document defines the electrical and mechanical requirements for 260 pin, 1.2 V (VDD), Small Outline, Double Data Rate, Synchronous DRAM Dual In-Line Memory Modules (DDR4 SDRAM SODIMMs). These DDR4 SODIMMs are intended for use as main memory when installed in PCs, laptops and other systems. This document also contains the DDR4 DIMM Label, Ranks Definition. Item 2224.13A

MODULE4.20.25 Aug 2019 view
SPD Annex L, Serial Presence Detect (SPD) for DDR4 SDRAM Modules, Release 4

This annex describes the serial presence detect (SPD) values for all DDR4 modules covered in Document Release 4. Differences between module types are encapsulated in subsections of this annex. These presence detect values are those referenced in the SPD standard document for ‘Specific Features’. Item 2220.01G. This is an editorial revision to the publication in January 2017.

SPD4.1.2.L-4 Aug 2019 view
SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)

The Serial Flash Discoverable Parameter (SFDP) standard provides a consistent method of describing the functional and feature capabilities of serial flash devices in a standard set of internal parameter tables. These parameter tables can be interrogated by host system software to enable adjustments needed to accommodate divergent features from multiple vendors. Any company may request a Function Specific ID by making a request to the JEDEC office at juliec@jedec.org. Please include “Function Specific ID Request, JESD216” in the email subject line. Item 1775.15 and 1775.18.

JESD216D.01 Aug 2019 view
DDR4 DIMM Product Label, Hybrid, Pre-Production, DDR4E

This section covers DDR4 and DDR4E in both DRAM-only module types and Hybrid module types, as well as pre-production modules of both types. Item 2224.13A

DIMM-LABEL4.19.4 Aug 2019 view
DDR4 REGISTERING CLOCK DRIVER (DDR4RCD02)

This document defines standard specifications of DC interface parameters, switching parameters, and test loading for definition of the DDR4 Registering Clock Driver (RCD) with parity for driving address and control nets on DDR4 RDIMM and LRDIMM applications. Any TBDs as of this document, are under discussion by the formulating committee. Item 314.08F.

*If you downloaded this file between 8/7/2019 and 8/14/2019, please download again, the publication date on the document was incorrected and has been fixed.

JESD82-31A Aug 2019 view
DDR4 DATA BUFFER DEFINITION (DDR4DB02)

This standard defines standard specifications for features and functionality, DC and AC interface parameters and test loading for definition of the DDR4 data buffer for driving DQ and DQS nets on DDR4 LRDIMM applications. Any TBDs as of this document, are under discussion by formulating committee. Item 314.11D

*If you downloaded this file between 8/7/2019 and 8/14/2019, please download again, the publication date on the document was incorrected and has been fixed.

JESD82-32A Aug 2019 view
DDR5 DIMM SMT 288 PIN SOCKET OUTLINE 0.85 MM PITCH SKT

Item 11.14-196

SO-023B Jul 2019 view
THERMAL TEST CHIP GUIDELINE (WIRE BOND AND FLIP CHIP)

The purpose of this document is to provide a design guideline for thermal test chips used for integrated circuit (IC) and transistor package thermal characterization and investigations. The intent of this guideline is to minimize the differences in data gathered due to nonstandard test chips and to provide a well-defined reference for thermal investigations.

JESD51-4A Jul 2019 view
MECHANICAL SHOCK – DEVICE AND SUBASSEMBLY

Device and Subassembly Mechanical Shock Test Method is intended to evaluate devices in the free state and assembled to printed wiring boards for use in electrical equipment. The method is intended to determine the compatibility of devices and subassemblies to withstand moderately severe shocks. The use of subassemblies is a means to test devices in usage conditions as assembled to printed wiring boards. Mechanical Shock due to suddenly applied forces, or abrupt change in motion produced by handling, transportation or field operation may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test intended for device qualification.This document also replaces JESD22-B104.

JESD22-B110B.01 Jun 2019 view
POD135 - 1.35 V PSEUDO OPEN DRAIN I/O

This standard defines the dc and ac single-ended (data) and differential (clock) operating conditions, I/O impedance's, and the termination and calibration scheme for 1.35 V Pseudo Open Drain I/Os. The 1.35 V Pseudo Open Drain interface, also known as POD135, is primarily used to communicate with GDDR5 or GDDR5M SGRAM devices. Item 146.01B

JESD8-21C Jun 2019 view
NAND FLASH INTERFACE INTEROPERABILITY

This document defines a standard NAND flash device interface interoperability standard that provides means for a system to be designed that can support Asynchronous SDR, Synchronous DDR and Toggle DDR NAND flash devices that are interoperable between JEDEC and ONFI member implementations. This standard was jointly developed by JEDEC and the Open NAND Flash Interface Workgroup, hereafter referred to as ONFI. Item 1765.00

JESD230D Jun 2019 view
POD125 - 1.25 V PSEUDO OPEN DRAIN I/O

This standard defines the DC and AC single-ended (data) and differential (clock) operating conditions, I/O impedances, and the termination and calibration scheme for 1.25 V Pseudo  Open Drain I/Os. The 1.25 V Pseudo Open Drain interface, also known as POD125, is primarily used to communicate with GDDR6 SGRAM devices.

JESD8-30A Jun 2019 view
0.5 V LOW VOLTAGE SWING TERMINATED LOGIC (LVSTL05)

This standard defines power supply voltage range, dc interface, switching parameter and overshoot/undershoot for high speed low voltage swing terminated NMOS driver family digital circuits. The specifications in this standard represent a minimum set of interface specifications for low voltage terminated circuits. Item 159.03

JESD8-33 Jun 2019 view
288-Pin, 1.2 V (VDD), PC4-1600/PC4-1866/PC4-2133/PC4-2400/PC4-2666/PC4-3200 DDR4 SDRAM Registered DIMM Design Specification

This specification defines the electrical and mechanical requirements for 288-pin, 1.2 Volt (VDD), Registered, Double Data Rate, Synchronous DRAM Dual In-Line Memory Modules (DDR4 SDRAM RDIMMs). These DDR4 Registered DIMMs (RDIMMs) are intended for use as main memory when installed in PCs. Item 2149.05E

MODULE4.20.28 May 2019 view
Registration - Silicon Bottom Grid Array Column, 0.048 x 0.0275 Pitch, Rectangular Family Package

Package Designator: SBGA-M#(#)_I0p055

Item Number: 11.4-966

MO-316B Apr 2019 view

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