Global Standards for the Microelectronics Industry
JEDEC and ESD Association Announce Publication of New Joint Standard for Component Level Electrostatic Discharge Sensitivity Testing – Charged Device Model
The ESD Association and JEDEC Solid State Technology Association today announced the publication of ANSI/ESDA/JEDEC JS-002-2014 for Electrostatic Discharge Sensitivity (ESD) Testing – Charged Device Model (CDM) – Device Level. The product of a JEDEC/ESDA agreement to produce joint standards in the field of device ESD sensitivity testing, the new standard is intended to replace the existing Charged Device Model ESD standards (JESD22-C101 and ANSI/ESD S5.3.1). A complimentary download of ANSI/ESDA/JEDEC JS-002-2014 may be obtained from www.JEDEC.org or www.ESDA.org.
ANSI/ESDA/JEDEC JS-002 establishes an improved procedure for testing, evaluating and classifying components and microcircuits according to their susceptibility to damage or degradation by exposure to a defined charged device model (CDM) electrostatic discharge (ESD). ESD can significantly impair the reliability and operation of solid state devices, and accurate test methodologies are critical to the industry as technology advances and device complexity increases.
As was the case with the publication of their first joint ESD standard in 2010 for Human Body Model ESD testing, JEDEC and ESDA expect this harmonized test method for CDM to benefit the industry by eliminating confusion and duplication of effort in the industry. One key objective for the merger of the previously used test methods was to preserve the JESD22-C101 voltage classifications in the new standard. This has been accomplished in JS-002 with minimal hardware changes required.
JEDEC and ESDA also expect this harmonization will remove any barriers device suppliers may have had to reporting or communicating CDM sensitivity data to their customers in datasheets or other documents. While it has been known for some time that CDM is by far the dominant ESD failure cause in production, only a small percentage of datasheets (approximately 10%) currently have this vitally important information compared to over 75% for HBM. Users of ESD sensitive devices should be asking for this information as part their ESD control program management.
“ESDA is delighted that our collaboration with JEDEC has enabled both organizations to serve the industry through the development of joint standards for ESD testing, and we look forward to continuing our joint efforts to improve ESD test methods and adapt them to new technologies,” said Terry Welsher, President of the ESD Association.
John Kelly, President of JEDEC, added, “By joining forces to develop JS-001 and JS-002, ESDA and JEDEC have answered the industry call for clarity with regard to test methods for ESD, and we look forward to our continued partnership with ESDA.”
About ESD Association (www.ESDA.org)
The ESD Association is a not-for-profit, ANSI accredited, professional organization directed by volunteers dedicated to furthering the technology and understanding of electrostatic discharge. The Association sponsors education programs, develops ESD standards, holds an annual technical symposium, and fosters the exchange of technical information among its more than 1500 members representing over 800 companies as well as other interested parties from academia, the military and industry.
About JEDEC (www.JEDEC.org)
JEDEC is the global leader in the development of standards for the microelectronics industry. Thousands of volunteers representing nearly 300 member companies work together in 50 JEDEC committees to meet the needs of every segment of the industry, manufacturers and consumers alike. The publications and standards generated by JEDEC committees are accepted throughout the world. All JEDEC standards are available for free download from the JEDEC website. For more information, visit www.jedec.org.