|ROCS Workshop (Formerly the GaAs REL Workshop)|
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|Call for Papers|
|The annual workshop on Compound Semiconductor Reliability will be held one day before
Compound Semiconductor MANufacturing TECHnology Conference
with the objective of bringing together researchers, manufacturers, & users of compound devices.
Papers presenting the latest results and new developments in all phases of compound semiconductor reliability are solicited.
Original papers discussing work in progress and emerging device technologies are acceptable and encouraged.
Topics of interest include:
Metallization Studies Cost of Reliability Thermal Analysis
Electromigration Quality Assurance Accelerated Testing
Materials Defects Reliability Standards Radiation Effects
Drift, Backgating Ionic Migration Novel Device Problems
ESD/EOS/Pulse Burnout Hot Electron Effects Environmental Effects
Details = Call for Papers PDF
Reliability Of Compound