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Title Document # Datesort descending

Registration - Header Family, Peripheral Terminal. Variations AA-AB. (SOT-89). Item 11.10-213.

 TO-243-C

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Flange-Mounted Family, Rectangular Base. Variation AA-AB. Item 11.2-105.

 TO-244-B

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Dual-In-Line (DIP) Family, .300 inch Row Spacing, 4 Lead. Item 120.

 TO-250-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Flange-Mounted Header Family, Peripheral Terminals. Item 11.10-229

 TO-254-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Revision to 4 Lead Small Outline Transistor (SOT). Item 11.10-380

 TO-253-D

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Flat Mounted Transistor. Item 11.10-245.

 TO-256-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Revision - Flange Mounted Header Family (Peripheral Terminals). Item 11.10-361.

 TO-257-C

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Hermetic Flange-Mounted Header Family, Peripheral Leads, .200 inch Wide, 5.08 Spacing, 3 Leads. Item 11.10-251.

 TO-258-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Addition of Variation AB to Flange-Mounted Header Family. Item 11.10-307.

 TO-259-B

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Ceramic Header Axial 3-Lead.

 TO-260-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Flange-Mounted Header Family, Straight Leads, Similar to TO-220. Item 11.10-288

 TO-262-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Flange-Mounted Header Family, 3 Lead, Peripheral Leaded Package. Item 11.10-.

 TO-264-B

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - 3 Lead Flange-Mounted Ceramic Power Package.R-CSFM-T3. Item 11.10-309.

 TO-265-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Opto Family, Insertion Mount, Peripheral Terminals. Item 11.10-336.

 TO-266-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registrtaion - Hermetic Flange-Mounted Header Family, Peripheral Terminals, 3 Lead, 5.0 Spacing. R-MSFM-X3. Item 11.10-349.

 TO-267-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Surface Mounted Header Family, Peripheral Terminals. R-PSFM-G2. Item 11.10-352.

 TO-268-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - 4 Lead Small Outline Package (SOP). Item 11.10-358

 TO-269-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - 4 Lead Quad Flat Pack (QFP).

 TO-271-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - 3 Lead Plastic Flange-Mounted Package. Item 11.10-401

 TO-274-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Standard - Plastic Single-in-Line Flange-Mounted, 5 Leads. PSFM. Item 11.10-220.

 TS-001-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Standard - Header Family, Insertion Mount, Peripheral Terminals. Item 11.10-322S

 TS-002-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Standard - Header Family, Surface Mounted, Peripheral Terminals. R-PSFM-G2. Item 11.10-323S.

 TS-003-B

Committee(s): JC-11

JEP95 Registrations Main Page

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Standard - Surface Mounted Header Family, 2 Leads, Peripheral Terminals. R-PSFM-G. Item 11.10-327S.

 TS-005-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Standard - Flange-Mounted Header Family. R-PSFM-F3. Item 11.10-326S.

 TS-004-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Metric Super Format Tape Automated Bonding (TAB) Package Family.

 UO-018-B

Committee(s): JC-11

JEP95 Registrations Main Page

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Registration - Tape Automated Bonding (TAB) Package, 10, 15 and 20 mil Pitch Uncased Outline. Item 11.4-235/236/237.

 UO-017-A

Committee(s): JC-11

JEP95 Registrations Main Page

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Standard - Tape Automated Bonding (TAB) Package Family. S-PQUC-X/TAB.

 US-001-B

Committee(s): JC-11

JEP95 Registrations Main Page

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Standard - Dual-In-Line Plastic Family .300 inch Row Spacing. R-PDIP-T. Item 11.11-271S

 MS-001-D

Committee(s): JC-11

JEP95 Registrations Main Page

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Replaced - See MS-026-C. Item 11.11-483S.

 MO-136-A

Committee(s): JC-11

JEP95 Registrations Main Page

Replaced - See MS-028-A. Item 11.11-482S. (Plastic BGA 1.27 mm Pitch).

 MO-163-B

Committee(s): JC-11

JEP95 Registrations Main Page

Replaced - See CS-001. (Metric Tape Automated Bonding (TAB) Magazine Family, 50, 100 Leads). Item 11.5-297

 CO-017-B

Committee(s): JC-11

JEP95 Registrations Main Page

Replaced - See CS-006-A. (Metric Tape Automated Bonding (TAB) Tape Carrier Family. Variations AA-AE, BA-BC). Item 11.5-296.

 CO-018-A

Committee(s): JC-11

JEP95 Registrations Main Page

Replaced - See CS-008-A. Item 11.5-437. (TSOP I Tray).

 CO-020-A

Committee(s): JC-11

JEP95 Registrations Main Page

Replaced - See CS-007-A

 CO-024-A

Committee(s): JC-11

JEP95 Registrations Main Page

Replaced - See TO-244-B, Variations AA-AB.

 DO-211-A

Committee(s): JC-11

JEP95 Registrations Main Page

Replaced - See MS-033-A. Item 11.10-382S. (Flatpack Family, .200 inch Width, .050 inch Pitch. Variations AJ-AK. Item 11.10-390).

 MO-003-C

Committee(s): JC-11

JEP95 Registrations Main Page

Replaced - See MS-033-A. Item 11.10-382S. (Flatpack Family, 10.16 mm Width, 1.27 Pitch. Variations AA-AD. Item 11.10-392).

 MO-019-D

Committee(s): JC-11

JEP95 Registrations Main Page

RESCINDED - 48 Pin Ceramic Flatpack, Top Brazed.

 MO-101-A

Committee(s): JC-11

JEP95 Registrations Main Page

RESCINDED - Tape Quad Flatpack Family.

 MO-102-A

Committee(s): JC-11

JEP95 Registrations Main Page

Standard Practices and Procedures - Use of -PROPOSED- on Ballots.

 SPP-007

Committee(s): JC-11

JEP95 Registrations Main Page

Free download. Registration or required.

For Shunichi Saito only

 TENTSTDSAITO

Editable file for JESD 209 -4 Graphics

Free download. Registration or required.

Editable file for Saito-san

 TENTSTD2.0.9-5

This is the editable file for 2.0.9-5 rev. A

Free download. Registration or required.

TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE

Status: Reaffirmed November 1963, June 1972, April 1981, April 1999, October 2002 		JESD284-A Nov 1963

The test methods described in this Standard are generally applicable to alloy-like devices for which the usual simplified equivalent circuits can be employed. Formerly known as EIA-284-A (November 1963). Became JESD284-A when reaffirmed in October 2002.

Committee(s): JC-25

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RANGES AND CONDITIONS FOR SPECIFYING BETA FOR LOW POWER, AUDIO FREQUENCY TRANSISTORS FOR ENTERTAINMENT SERVICE:

Status: ReaffirmedApril 1981, April 1999, March 2009 		JESD302 Jan 1965

This standard establishes the preferred rating ranges and conditions for specifying beta for low power, audio frequency transistors intended for entertainment service. Formerly known as RS-302 and EIA-302.

Committee(s): JC-25

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MEASUREMENT OF SMALL SIGNAL HF, VHF, AND UHF POWER GAIN OF TRANSISTORS

Status: Reaffirmed April 1981, April 1999, March 2009 		JESD306 May 1965

This standard provides a method of measurement for small-signal HF, VHF, and UHF power gain of low power transistors. Formerly known as RS-306 and/or EIA-306.

Committee(s): JC-25

Free download. Registration or required.

VOLTAGE REGULATOR DIODE NOISE VOLTAGE MEASUREMENT

Status: Reaffirmed January 1992, April 1999, April 2002 		JESD307 May 1965

This standard is intended to cover the measurement of noise voltage in voltage regulator diodes in the reverse breakdown region. It describes noise voltage measurements at specified conditions, but may be used as a guide for making such measurements at other than specified conditions. Formerly known as RS-307 and/or EIA-307

Committee(s): JC-22.4

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STANDARD MEASURMENTS OF THE ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR INTEGRATED CIRCUITS

Status: RescindedOct-84 		JEB6 Jan 1966

Committee(s): JCJEDC

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES:

Status: ReaffirmedFebruary 1972, November 2002 		EIA323 Mar 1966

This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.

Committee(s): JC-22.1

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MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE:

Status: ReaffirmedSeptember 1981, April 1999, October 2002 		JESD6 Feb 1967

This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.

Committee(s): JC-25

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STANDARD FOR THE MEASUREMENT OF CRE

Status: Reaffirmed April 1981, April 1999, March 2009 		JESD340 Nov 1967

This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340.

Committee(s): JC-25

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TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS:

Status: ReaffirmedSeptember 1981, April 1999 		JEP65 Dec 1967

This publication describes tests which are intended to represent the verification of maximum ratings for data sheets; they are not tests for performance or quality level. This material is to be used in conjunction with formats developed for device registration and defining data.

Committee(s): JC-25

Free download. Registration or required.

ALPHA NUMERIC GRID SYSTEM FOR DESIGNATING TERMINAL LEAD POSITIONS

Status: Incorporatedinto JEP95, November 1982 		JEB8 Jan 1968

Incorporated into JEP95

THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD

Status: Reaffirmed April 1981, April 1999, March 2009 		JESD353 Apr 1968

This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353

Committee(s): JC-25

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THE MEASUREMENT OF TRANSISTOR EQUIVALENT NOISE VOLTAGE AND EQUIVALENT NOISE CURRENT AT FREQUENCIES OF UP TO 20 kHz

Status: Reaffirmed April 1981, April 1999, March 2009 		JESD354 Apr 1968

This standard provides a method for determining values, for device registration purposes, for transistor equivalent noise voltage and equivalent noise current at frequencies up to 20 kHz. This method is applicable to transistors whose noise has a Gaussian, flat (white) or I/f power distribution. Formerly known as RS-354 and/or EIA-354

Committee(s): JC-25

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STANDARD LIST OF VALUES TO BE USED IN POWER TRANSISTOR DEVICE REGISTRATION AND MINIMUM DIFFERENCES FOR DISCRETENESS OF REGISTRATIONS - SUPERSEDED BY EIA-419-A, February 1996.

Status: Rescinded 		JEP74 Jan 1969

Committee(s): JC-25

TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS:

 JEB15 Jan 1969

This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.

Committee(s): JC-40

LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS:

 JEP79 Sep 1969

This publication is for photoconductive cells sensitive primarily in the visible and near infrared region.

Free download. Registration or required.

RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORS:

 JEP78 Oct 1969

The intent of this publication is to facilitate the specification of infrared detector diodes, particularly in conjunction with the preparation of data for JEDEC type registration.

Committee(s): JC-COUN

Free download. Registration or required.

PERFORMANCE TEST PROCEDURE FOR SOLAR CELLS AND CALIBRATION PROCEDURE FOR SOLAR CELL STANDARDS FOR SPACE VEHICLE SERVICE:

Status: ReaffirmedFebruary 1984 		EIA365 Nov 1969

The purpose of this standard is to classify the output of solar cells for space vehicle service in accordance with requirements of EIA Format JS4-RDF4.

Committee(s): JC-23.1

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Registration - Horizontal Staggered Surface Mount Package 0.40 mm Lead Pitch. Item 11.11-514.

 MO-213-A Dec 1969

Committee(s): JC-11

JEP95 Registrations Main Page

Free download. Registration or required.

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