Global Standards for the Microelectronics Industry
Standards & Documents Search
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Document # | Date |
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Automotive Solid State Drive (SSD) Device StandardRelease Number: 1.1 |
JESD312 | Jan 2025 |
This standard defines the specifications of interface parameters, signaling protocols, environmental requirements, packaging, and other features for a solid state drive (SSD) targeted primarily at automotive applications. Free download. Registration or login required. |
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AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS |
JESD210A | Mar 2017 |
This standard is applicable to avalanche breakdown diodes when used as a surge protector or transient voltage suppressor (TVS). It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics. This standard may be applied to other surge-protection components with similar characteristics as the ABD. Committee(s): JC-22.2, JC-22.5 Free download. Registration or login required. |
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Backup Energy Module Standard for NVDIMM Memory Devices (BEM) |
JESD315 | Dec 2021 |
This standard defines the functional requirements of Backup Energy Module (BEM), henceforth referred to as BEM in this standard. This module shall be used to provide backup power to the Industry Defined Storage Array Controller Cards and NVDIMM-n as applicable. All standards are applicable under all operating conditions unless otherwise stated. Item 2279.03 Committee(s): JC-45 Free download. Registration or login required. |
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BALL GRID ARRAY PINOUT FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS: |
JESD75-4 | Mar 2004 |
This standard defines device pinout for 1-, 2- and 3-bit wide logic functions. This pinout specifically applies to the conversion of Dual-Inline-Packaged (DIP) 1-, 2- and 3-bit logic devices to DSBGA-packaged 1-, 2- and 3-bit logic devices. Committee(s): JC-40 Free download. Registration or login required. |
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BALL GRID ARRAY PINOUTS STANDARDIZED FOR 16, 18, AND 20-BIT LOGIC FUNCTIONS USING A 54 BALL PACKAGE: |
JESD75-1 | Oct 2001 |
This standard establishes a 54 Ball Grid Array pinout for 16, 18 and 20-bit standard logic devices that are currently being produced in 48 and 56 Pin SSOP and TSSOP packages. The 54 Ball Grid Array Package is organized as a 6 x 9 array with balls on a .8mm x .8mm grid pitch. Committee(s): JC-40 Free download. Registration or login required. |
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BALL GRID ARRAY PINOUTS STANDARDIZED FOR 16-BIT LOGIC FUNCTIONS: |
JESD75-2 | Jul 2001 |
This standard provides a pinout standard for 16-bit wide logic devices offered in a 56-ball areagrid array package to provide for uniformity, multiplicity of sources, elimination of confusion,ease of device specification, and ease of use. Committee(s): JC-40 Free download. Registration or login required. |
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BALL GRID ARRAY PINOUTS STANDARDIZED FOR 32-BIT LOGIC FUNCTIONS: |
JESD75 | Nov 1999 |
The purpose of this standard is to provide a pinout standard for dual-die 32-bit logic devices offered in a 96- and 144-ball grid array package for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease use. This standard defines device output for 32-bit wide buffer, driver and transceiver functions. This pinout specifically applies to the conversion of DIP-packaged 16-bit logic devices to LFBGA-packaged dual-die 32-bit logic devices. Committee(s): JC-40 Free download. Registration or login required. |
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BALL GRID ARRAY PINOUTS STANDARDIZED FOR 8-BIT LOGIC FUNCTIONS: |
JESD75-3 | Jul 2001 |
This standard provides a pinout standard for 8-bit logic devices offered in a 20-ball area gridarray package to provide for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease of use. Committee(s): JC-40 Free download. Registration or login required. |
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BEADED THERMOCOUPLE TEMPERATURE MEASUREMENT OF SEMICONDUCTOR PACKAGESStatus: ReaffirmedJune 2006, September 2011, January 2015 |
JEP140 | Jun 2002 |
The beaded thermocouple temperature measurement guideline provides a procedure to accurately and consistently measure the temperature of semiconductor packages during exposure to thermal excursions. The guideline applications can include, but not limited to, temperature profile measurement in reliability test chambers and solder reflow operations that are associated with component assembly to printed wiring boards. Free download. Registration or login required. |
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Bit Wide DRAM |
DRAM3.9.1 | Jun 1999 |
Release No. 9 Committee(s): JC-42 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Bit Wide ECL SRAM |
SRAM3.7.2 | Jul 1997 |
Release No. 9 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Bit Wide SDRAM |
SDRAM3.11.1 | Jun 1997 |
Release No.9 Committee(s): JC-42 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Bit Wide TTL SRAM |
SRAM3.7.1 | Dec 1995 |
Release No. 5 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF SMT ICs FOR HANDHELD ELECTRONIC PRODUCTS |
JESD22-B113B | Aug 2018 |
The Board Level Cyclic Bend Test Method is intended to evaluate and compare the performance of surface mount electronic components in an accelerated test environment for handheld electronic products applications. The purpose is to standardize the test methodology to provide a reproducible performance assessment of surface mounted components while duplicating the failure modes normally observed during product level test. This is not a component qualification test and is not meant to replace any product level test that may be needed to qualify a specific product and assembly. Free download. Registration or login required. |
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Board Level Drop Test Method of Components for Handheld Electronic Products |
JESD22-B111A.01 | Jun 2024 |
This Test Method standardizes the test board and test methodology to provide a reproducible assessment of the drop test performance of surface mounted components. Free download. Registration or login required. |
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BOND WIRE MODELING STANDARD: |
JESD59 | Jun 1997 |
This standard describes the modeling of a bond wire from an integrated circuit (IC) die to a package lead in a ball or wedge type wire bond configuration. Committee(s): JC-15.2 Free download. Registration or login required. |
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BUS INTERCONNECT LOGIC (BIC) FOR 1.2 V |
JESD8-16A | Nov 2004 |
This standard defines the electrical parameters for high-speed interfaces for use in the 1.2V electrical environment. Included in the standard are a single ended signaling interface suitable for parallel buses, and a differential signaling interface suitable for clock applications or parallel differential buses. JEDEC BIC Standard JESD8-16A continues the tradition of the JESD8-xx standards, defining electrical interfaces for the industry as new technologies and bus requirements develop. Previously, JEDEC defined standard JESD8-6, the HSTL standard, for use in 1.5V electrical environments. BIC is similar to HSTL, except the power supply voltage has dropped from 1.5V to 1.2V, and interface requirements are tightened to allow much higher speeds Committee(s): JC-16 Free download. Registration or login required. |
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BYTE ADDRESSABLE ENERGY BACKED INTERFACE |
JESD245E | Apr 2022 |
This standard specifies the host and device interface for a DDR4 NVDIMM-N, which is a DIMM that achieves non-volatility by copying SDRAM contents into non-volatile memory (NVM) when host power is lost using an Energy Source managed by either the module or the host. This standard is used in conjunction with JESD248. Item 2233.54G Committee(s): JC-45.6 Free download. Registration or login required. |
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Byte Wide |
EPROM3.4.1 | Jul 1997 |
Release No.9 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Byte Wide DRAM |
DRAM3.9.3 | Jun 1999 |
Release No. 9 Committee(s): JC-42 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Byte Wide ECL SRAM |
SRAM3.7.6 | Jul 1997 |
Release No. 9 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Byte Wide EEPROM |
EEPROM3.5.1 | Aug 2005 |
Release No. 14 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Byte Wide MPDRAM |
MPDRAM3.10.2 | Jun 1997 |
Release No.9 Committee(s): JC-42 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Byte Wide PROM |
PROM3.3.2 | Dec 1993 |
Release No.1 Committee(s): JC-42 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Byte Wide ROM |
ROM3.2.1 | Dec 1992 |
Release No.2 Committee(s): JC-42 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Byte Wide SDRAM |
SDRAM3.11.3 | Jan 2004 |
Release No.13 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Byte Wide SRAM |
SRAM3.7.5 | Apr 2003 |
Release No.12 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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CERAMIC PACKAGE SPECIFICATION FOR MICROELECTRONIC PACKAGES - SUPERSEDED BY JESD9B, May 2011.Status: Rescinded, May 2011 |
JESD27 | Aug 1993 |
The intent of this standard is to be a guide in the manufacture and procurement of ceramic packages, especially for the hybrid industry. Manufacturers or ceramic packages and procuring activities for these packages will now be able to use this document as the means for agreement in the imposition of minimum requirements in qualification, screening, and quality conformance. Free download. Registration or login required. |
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CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPERATURESStatus: Reaffirmed September 2019 |
JEP153A | Mar 2014 |
This document provides an industry standard method for characterization and monitoring thermal stress test oven temperatures. The procedures described in this document should be used to insure thermal stress test conditions are being achieved and maintained during various test procedures. Free download. Registration or login required. |
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CHARACTERIZATION OF INTERFACIAL ADHESION IN SEMICONDUCTOR PACKAGES |
JEP167A | Nov 2020 |
This document identifies methods used for the characterization of die adhesion. It gives guidance which method to apply in which phase of the product or technology life cycle. Committee(s): JC-14.1 Free download. Registration or login required. |
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CHIP CARRIER PINOUTS STANDARDIZED FOR CMOS 4000, HC AND HCT SERIES OF LOGIC CIRCUITS: |
JESD11 | Dec 1984 |
This standard indicates the procedures used to convert existing DIP and flat packages for digital parts (SSI & MSI) to chip carrier packages. Committee(s): JC-40.2 Free download. Registration or login required. |
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CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATION |
JEP156A | Mar 2018 |
This publication references a set of frequently recommended and accepted JEDEC reliability stress tests. These tests are used for qualifying new and modified technology/ process/ product families, as well as individual solid state surface-mount products. Free download. Registration or login required. |
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CLASSIFICATION OF PASSIVE AND SOLID STATE DEVICES FOR ASSEMBLY PROCESSES |
J-STD-075A | May 2018 |
This is a Joint Standard between ECIA, IPC, and JEDEC. The purpose of this specification is to establish an agreed to set of worst case solder assembly process conditions to which devices are evaluated. The generated PSL rating will convey the conditions to which a device can be safely attached to FR4 type or ceramic laminates using SMT reflow and solder wave/fountain soldering processes. It is important for device manufacturers (hereafter referred to as “suppliers”), users, and (PWB) assemblers to be highly familiar with this standard’s information and processes to insure optimal device quality and reliability. THIS DOCUMENT IS NOT AVAILABLE FOR FREE DOWNLOAD. However, this document is available to the JEDEC formulating Committee members on the JC-14 Resources tab on the Members' website. The lead organization is ECIA. Committee(s): JC-14 |
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CMOS SEMICUSTOM DESIGN GUIDELINES: |
JEP116 | Nov 1991 |
The design of ASIC circuits is becoming a significant part of system or product design, yet many problems continue to exist in current design practice. The guidelines in this document provide an explanation of common ASIC design problems and concerns and where possible offer solutions. Committee(s): JC-44 Free download. Registration or login required. |
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COLOR CODING OF DISCRETE SEMICONDUCTOR DEVICESStatus: Reaffirmed November 1999, September 2009 |
JESD236-C | Mar 1986 |
This standard details the methods to be followed if color coding is used to identify JEDEC-assigned type numbers or for cathode identification of discrete semiconductor devices. Formerly known as EIA-236-C and/or ANSI/EIA-236-C-1986 (1995). Committee(s): JC-10 Free download. Registration or login required. |
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COMMON FLASH INTERFACE (CFI) IDENTIFICATION CODES: |
JEP137B | May 2004 |
This publication is a companion document to the Common Flash Interface (CFI) standard, JESD68, which outlines the device and host system software interrogation handshake. JEP137 documents ID Code assignments for: 1)) the Algorithm-specific Command Set and Control Interfaces and 2) the Device Interfaces. It is published as needed when additions are made to either of these lists of codes. To make a request for an ID Code please contact the JEDEC Office at (703)907-7558. Committee(s): JC-42.4 Free download. Registration or login required. |
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COMMON FLASH INTERFACE (CFI): |
JESD68.01 | Sep 2003 |
The Common Flash Interface (CFI) specification outlines a device and host system software interrogation handshake that allows specific software algorithms to be used for entire families of devices. This allows device-independent, JEDEC ID-independent, and forward- and backward-compatible software support for the specific flash families. It allows flash vendors to standardize their existing interfaces for long-term compatibility. The changes for this minor revision are indicated in Annex A on page 11. Committee(s): JC-42.4 Free download. Registration or login required. |
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COMPACT THERMAL MODEL OVERVIEW |
JESD15-1.01 | Mar 2023 |
Terminology update. This document should be used in conjunction with the parent document, and is intended to function as an overview to support the effective use of Compact Thermal Model (CTM) methodologies as specified in the companion methods documents. Free download. Registration or login required. |
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COMPONENT PROBLEM ANALYSIS AND CORRECTIVE ACTION REQUIREMENTS - SUPERSEDED BY EIA-671, November 1996.Status: Superseded |
JESD43 | Nov 1996 |
Committee(s): JC-14.4 Free download. Registration or login required. |
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Compression Attached Memory Module (CAMM2) Common Standard |
JESD318A Ver. 1.10 | Nov 2024 |
This standard defines the electrical and mechanical requirements for Double Data Rate, Synchronous DRAM Compression-Attached Memory Modules (DDR5 SDRAM CAMM2s) and Low Power Double Data Rate, Synchronous DRAM Compression-Attached Memory Modules (LP5 SDRAM CAMM2s). Committee(s): JC-45 Free download. Registration or login required. |
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CONDITIONS FOR MEASUREMENT OF DIODE STATIC PARAMETERS:Status: ReaffirmedApril 1999, April 2002 (Original publication July 1965) |
JESD320-A | Dec 1992 |
This standard provides guidance for achieving equilibrium when measuring temperature sensitive static parameters of signal diodes. Formerly known as EIA-320-A. Committee(s): JC-22.4 Free download. Registration or login required. |
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CONFIGURATIONS FOR SOLID STATE MEMORIES:Status: Under RevisionSections in this document may be under revision at any time. |
JESD21-C | Jan 2003 |
This revision of JESD21 is substantially different from previous issues because it reflects advancement in semiconductor technology and computer design needs. A new class of memory devices, the multiport DRAM (MPDRAM) C also know as 'Video Ram' because of the most common application for the devices C is represented. A new family of SRAMs which addresses the increasing need for high speed is introduced. Additional families of devices in the SOJ and Zip packages are included. The material in this revision is organized primarily by function (ROM, EPROM, SRAM, DRAM, etc.) rather than by technology and word length. Pinouts for SIMM and DIMM are included along with presence detect schemes. A current set of terms has also been included. JESD21-C is a compilation of all memory device standards that have been developed by the JC-42 Committee and approved by the JEDEC BoD from September 1989 to present. This latest issue has changed to a loose-leaf format and comes in a three-ring binder so that new drawings can be added without requiring a new publication. Time of publication of the material is identified by release number, i.e., if marked Release 8, this item was approved and released in 1998, if marked Release 13, this item was approved and released in 2003. Committee(s): JC-42 |
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CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING |
JESD214.01 | Aug 2017 |
This document describes a constant temperature (isothermal) aging method for testing copper (Cu) metallization test structures on microelectronics wafers for susceptibility to stress-induced voiding (SIV). This method is to be conducted primarily at the wafer level of production during technology development, and the results are to be used for lifetime prediction and failure analysis. Under some conditions, the method may be applied to package-level testing. This method is not intended to check production lots for shipment, because of the long test time. Committee(s): JC-14.2 Free download. Registration or login required. |
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COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICESStatus: Reaffirmed February 2023 |
JESD22-B108B | Sep 2010 |
The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity at room temperature for surface-mount semiconductor devices. This test method is applicable for inspection and device characterization. If package warpage or coplanarity is to be characterized at reflow soldering temperatures, then JESD22-B112 should be used. Free download. Registration or login required. |
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COPY-EXACT PROCESS FOR MANUFACTURING |
JEP185 | Aug 2021 |
This publication defines the requirements for Copy-Exact Process (CEP) matching, real-time process control, monitoring, and ongoing assessment of the CEP. The critical element requirements for inputs, process controls, procedures, process indicators, human factors, equipment/infrastructure and matching outputs are given. Manufacturers, suppliers and their customers may use these methods to define requirements for process transfer within the constraints of their business agreements. Committee(s): JC-14.3 Free download. Registration or login required. |
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COUNTERFEIT ELECTRONIC PARTS: NON-PROLIFERATION FOR MANUFACTURERS |
JESD243A | Jan 2021 |
This standard identifies the best commercial practices for mitigating and/or avoiding counterfeit products by all manufacturers of electronic parts including, but not limited to original component manufacturers (OCMs), authorized aftermarket manufacturers, and other companies that manufacture electronic parts under their own logo, name, or trademark. The types of product this standard applies to is limited to monolithic microcircuits, hybrid microcircuits and discrete semiconductor products. Committee(s): JC-13 Free download. Registration or login required. |
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CURRENT TIN WHISKERS THEORY AND MITIGATION PRACTICES GUIDELINEStatus: Reaffirmed February 2023 |
JP002 | Mar 2006 |
This document will provide insight into the theory behind tin whisker formation as it is known today and, based on this knowledge, potential mitigation practices that may delay the onset of, or prevent tin whisker formation. The potential effectiveness of various mitigation practices will also be briefly discussed. References behind each of the theories and mitigation practices are provided. Free download. Registration or login required. |
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Customer Notification for Environmental Compliance Declaration Deviations |
JESD262 | Nov 2022 |
This standard is invoked when a supplier becomes aware that a product’s environmental compliance declaration they provided or made available to their customers had an error that might cause a customer to draw an incorrect conclusion about the compliance of the product to legal requirements. Committee(s): JC-14.4 Free download. Registration or login required. |
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CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SOLID-STATE SUPPLIERSStatus: SupersededBy J-STD-046, July 2016 |
JESD46D | Dec 2011 |
This standard establishes procedures to notify customers of semiconductor product and process changes. Requirements include: documentation; procedures for classification, notification and customer response; content; and records. Documentation of a suppliers change notification system should set clear and understandable expectations for both the originators of the change and their end customers. |
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CUSTOMER NOTIFICATION PROCESS FOR DISASTERS |
JESD246A | Jan 2020 |
This standard establishes the requirements for timely notification to affected customers after a disaster has occurred at a supplier’s facility that will affect the committed delivery of product. This standard puts specific emphasis on notification, timing, and notification content which includes risk exposure, impact analysis, and recovery plans. This standard is applicable to suppliers of, and affected customers for, solid-state products and the constituent components used within. Committee(s): JC-14.4 Free download. Registration or login required. |
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CUSTOMER NOTIFICATION STANDARD FOR PRODUCT/PROCESS CHANGES BY ELECTRONIC PRODUCT SUPPLIERS |
J-STD-046 | Jul 2016 |
This standard is applicable to suppliers of, and affected customers for, electronic products and their constituent components. This standard establishes the requirements for timely customer notification of changes to electronic products and associated processes. This document replaces JESD46. Committee(s): JC-14.4 Free download. Registration or login required. |
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CYCLED TEMPERATURE HUMIDITY-BIAS WITH SURFACE CONDENSATION LIFE TEST |
JESD22-A100E | Nov 2020 |
The Cycled Temperature-humidity-bias Life Test is performed for the purpose of evaluating the reliability of nonhermetic packaged solid state devices in humid environments. It employs conditions of temperature cycling, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors that pass through it. The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages (e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 or JESD22-A110. Free download. Registration or login required. |
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DDR DIMM Product LabelRelease Number: 28 |
DIMM-LABEL4.19-1 | Dec 2018 |
Committee(s): JC-45 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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DDR Specific SDRAM Functions |
SDRAM3.11.5.2 | Jun 2003 |
Release No. 13 Committee(s): JC-42.3 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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DDR2 DIMM CLOCK SKEW MEASUREMENT PROCEDURE USING A CLOCK REFERENCE BOARD |
JEP152 | May 2007 |
This document is the work product of the JC-45.1 DDR2 DIMM Clock Skew Measurement task group.The purpose of this document is to define procedures to measure clock parameters on registered DIMMs using the DDR2 Clock Reference Board. It is NOT the intent of this document to set specification values or validation requirements. Free download. Registration or login required. |
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DDR2 DIMM Product LabelRelease Number: 28 |
DIMM-LABEL4.19.2 | Dec 2018 |
This section covers DDR2 DIMM labels. Committee(s): JC-45 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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DDR2 SDRAM STANDARD |
JESD79-2F | Nov 2009 |
This comprehensive standard defines all required aspects of 256Mb through 4Gb DDR2 SDRAMs with x4/x8/x16 data interfaces, including pinout, addressing, functional description, features, ac and dc parametrics, truth tables, and packages. Standard JESD79-2 uses a SSTL_18 interface, which is described in another JEDEC standard called JESD8-15. The purpose of this Standard is to define the minimum set of requirements for compliant devices 256Mb through 4Gb, x4/x8/x16 DDR2 SDRAMs. System designs based on the required aspects of this specification will be supported by all DDR2 SDRAM vendors providing compliant devices. Changes between versions is indicated in Annex A. Item 1778.01 Free download. Registration or login required. |
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DDR2 SPD INTERPRETATION OF TEMPERATURE RANGE AND (SELF-) REFRESH OPERATION |
JEP179 | Jun 2006 |
The purpose of this document is to explain the meaning of SPD setting (JESD21 SPD section) for DDR2 SDRAM (JESD79-2) in normal and extended temperature operationy67. Committee(s): JC-42.3 Free download. Registration or login required. |
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DDR2 Specific SDRAM Function |
SDRAM3.11.5.5 | Jul 2008 |
Release No. 18 Committee(s): JC-42.3 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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DDR3 240-Pin Connector S-Parameters SpecificationThis document was originally published in Section 4.20.19 of JESD21C, it is now placed in its own section, Section 4.8, in 21C. A cross-reference to Section 4.8 has been placed in Section 4.20.19. |
MODULE4.8 | Jun 2011 |
Release No. 21 Committee(s): JC-45.5 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |