Global Standards for the Microelectronics Industry
Standards & Documents Search
| Title | Document # |
Date |
|---|---|---|
POD125 - 1.25 V PSEUDO OPEN DRAIN I/O |
JESD8-30A.01 | Jun 2022 |
Editorial Terminology Update. This standard defines the DC and AC single-ended (data) and differential (clock) operating conditions, I/O impedances, and the termination and calibration scheme for 1.25 V Pseudo Open Drain I/Os. The 1.25 V Pseudo Open Drain interface, also known as POD125, is primarily used to communicate with GDDR6 SGRAM devices. Committee(s): JC-16 Free download. Registration or login required. |
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POD135 - 1.35 V PSEUDO OPEN DRAIN I/O |
JESD8-21C.01 | Jun 2022 |
Editorial, Terminology Update. This standard defines the dc and ac single-ended (data) and differential (clock) operating conditions, I/O impedance's, and the termination and calibration scheme for 1.35 V Pseudo Open Drain I/Os. The 1.35 V Pseudo Open Drain interface, also known as POD135, is primarily used to communicate with GDDR5 or GDDR5M SGRAM devices. Item 146.01B Committee(s): JC-16 Free download. Registration or login required. |
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DDR5 SODIMM Raw Card Annex E |
JESD309-S4-RCE | Jun 2022 |
This annex JESD309-S4-RCE, DDR5 Small Outline Dual Inline Memory Module with 4-bit ECC (EC4SODIMM) Raw Card E Annex" defines the design detail of x8, 2 Package Ranks DDR5 ECC SODIMM. The common feature of DDR5 SODIMM such as the connector pinout can be found in the JESD309, DDR5 Small Outline Dual Inline Memory Module (SODIMM) Common Standard. Free download. Registration or login required. |
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DDR5 SODIMM Raw Card Annex C Version 1 |
JESD309-S0-RCC | Jun 2022 |
This annex JESD309-S0-RCC, DDR5 Small Outline Dual Inline Memory Module (SODIMM) Raw CardC Annex defines the design detail of x16, 1 Package Ranks DDR5 SODIMM. The common feature of DDR5 SODIMM such as the connector pinout can be found in the JESD309, DDR5 Small Outline Dual Inline Memory Module (SODIMM) Common Standard. Free download. Registration or login required. |
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DDR5 SODIMM Raw Card Annex A Version 1 |
JESD309-S0-RCA | Jun 2022 |
This annex JESD309-S0-RCA, DDR5 Small Outline Dual Inline Memory Module (SODIMM) Raw Card A Annex defines the design detail of x8, 1 Package Rank DDR5 SODIMM. The common feature of DDR5 SODIMM such as the connector pinout can be found in the JESD309, DDR5 Small Outline Dual Inline Memory Module (SODIMM) Common Standard. Free download. Registration or login required. |
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DDR5 SODIMM Raw Card Annex D Version 1.0 |
JESD309-S4-RCD | Jun 2022 |
This annex JESD309-S4-RCD, DDR5 Small Outline Dual Inline Memory Module with 4-bit ECC (EC4 SODIMM) Raw Card D Annex defines the design detail of x8, 1 Package Rank DDR5 SODIMM with 4-bit ECC. The common feature of DDR5 SODIMM such as the connector pinout can be found in the JESD309, DDR5 Small Outline Dual Inline Memory Module (SODIMM) Common Standard. Committee(s): JC-45.3 Free download. Registration or login required. |
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SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)This document replaces JESD216F.01, Editorial changes to this document were approved by the TG, June 2022 |
JESD216F.02 | Jun 2022 |
The Serial Flash Discoverable Parameter (SFDP) standard provides a consistent method of describing the functional and feature capabilities of serial flash devices in a standard set of internal parameter tables. These parameter tables can be interrogated by host system software to enable adjustments needed to accommodate divergent features from multiple vendors. Any company may request a Function Specific ID by making a request to the JEDEC office at juliec@jedec.org. Please include “Function Specific ID Request, JESD216” in the email subject line. Item 1775.73. Editorial changes listed in Annex, from original publication of JESD216F (December 2021). Committee(s): JC-42.4 Free download. Registration or login required. |
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JEDEC COMMITTEE SCOPE MANUAL |
JM18T | Jun 2022 |
The JEDEC Board of Directors is responsible for establishing appropriate committees to conduct its standardization activities. These committees are assigned either service or product responsibilities. It is a primary function of each committee to propose JEDEC Standards and to formulate policies, procedures, formats, and other documents that are then submitted to the Board of Directors for action or approval. This publication identifies the service and product committees established by the Board of Directors and defines their scopes. Committee(s): JC-COUN Free download. Registration or login required. |
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SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD |
JESD218B.02 | Jun 2022 |
Terminology Update, see Annex. This standard defines JEDEC requirements for solid state drives. For each defined class of solid state drive, the standard defines the conditions of use and the corresponding endurance verification requirements. Although endurance is to be rated based upon the standard conditions of use for the class, the standard also sets out requirements for possible additional use conditions as agreed to between manufacturer and purchaser. Revision A includes further information on SSD Capacity. Items 303.19, 303.20, 303.21, 303.22, 303.23, 303.26, 303.27, 303.28, and 303.32 Committee(s): JC-64.8 Available for purchase: $76.00 Add to Cart Paying JEDEC Members may login for free access. |
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JEDEC COMMITTEE SPECIFIC ADDITIONAL POLICIES |
JM12B | Jun 2022 |
In some cases, JEDEC Committees have established additional policies and guidelines to facilitate the operation of a particular committee. Additional policies and guidelines are set forth here as an addendum to JM21 to facilitate the operation of particular committees. These policies are in addition to the requirements set forth in JM21 and in no case shall these additions contradict or supersede the requirements in JM21. Committee(s): JC-JEDC Free download. Registration or login required. |
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SOLID-STATE DRIVE (SSD) ENDURANCE WORKLOADS |
JESD219A.01 | Jun 2022 |
Terminology update, see Annex. This standard defines workloads for the endurance rating and endurance verification of SSD application classes. These workloads shall be used in conjunction with the Solid State Drive (SSD) Requirements and Endurance Test Method standard, JESD218. Also see JESD219A_MT and JESD219A_TT for the supporting trace files. Free download. Registration or login required. |
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DDR5 Unbuffered Dual Inline Memory Module (UDIMM) Common Standard |
JESD308 | May 2022 |
This standard defines the electrical and mechanical requirements for 288-pin, 1.1 V (VDD), Unbuffered, Double Data Rate, Synchronous DRAM Dual In-Line Memory Modules (DDR5 SDRAM UDIMMs). These DDR5 Unbuffered DIMMs (UDIMMs) are intended for use as main memory when installed in Computers. Item 2265.02B Committee(s): JC-45.3 Free download. Registration or login required. |
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DDR5 Small Outline Dual Inline Memory Module (SODIMM) Common Standard |
JESD309 | May 2022 |
This standard defines the electrical and mechanical requirements for 262-pin, 1.1 V (VDD), Small Outline, Double Data Rate, Synchronous DRAM Dual In-Line Memory Modules (DDR5 SDRAM SODIMMs). These DDR5 SODIMMs are intended for use as main memory when installed in Computers, laptops and other systems. Item 2262.06B Free download. Registration or login required. |
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EXPANDED SERIAL PERIPHERAL INTERFACE (xSPI) FOR NONVOLATILE MEMORY DEVICES |
JESD251C | May 2022 |
This standard specifies the eXpanded Serial Peripheral Interface (xSPI) for Non Volatile Memory Devices, which provides high data throughput, low signal count, and limited backward compatibility with legacy Serial Peripheral Interface (SPI) devices. It is primarily for use in computing, automotive, Internet Of Things (IOT), embedded systems and mobile systems, between host processing and peripheral devices. The xSPI electrical interface can deliver up to 400 MBytes per second raw data throughput. Item 1775.74. Committee(s): JC-42.4 Free download. Registration or login required. |
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Definition of the EE1002 and EE1002A Serial Presence Detect (SPD) EEPROMs |
SPD4.1.3-01 | May 2022 |
Release No. 19.01. Item 1739.02E, Terminology update. JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Mobile Platform Memory Module Thermal Sensor Component Specification |
MODULE4.7 | May 2022 |
Release No. 16.This replaces Release 15 and includes the following editorial changes: 1) Replaced master/slave with controller/target 2) Checked for presence of other sensitive words 3) Added Tables and Figures in Table of Contents(Release 15, Item 1640.07) Committee(s): JC-42.4 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Definitions of the EE1004-v 4 Kbit Serial Presence Detect (SPD) EEPROM and TSE2004av 4 Kbit SPD EEPROM with Temperature Sensor (TS) for Memory Module Applications |
SPD4.1.6-01 | May 2022 |
Release 26.01, Terminology update This standard defines the specifications of interface parameters, signaling protocols, and features for Serial Presence Detect (SPD) EEPROM (EE) and Temperature Sensor (TS) as used for memory module applications. Committee(s): JC-42.4 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Definition of the TSE2002av Serial Presence Detect (SPD) EEPROM with Temperature Sensor (TS) for Memory Module Applications |
SPD4.1.4-01 | May 2022 |
Release No. 21.01, Terminology update.This standard defines the specifications of interface parameters, signaling protocols, and features for Serial Presence Detect (SPD) EEPROMs and Temperature Sensor (TS) as used for memory module applications. The designation TSE2002av refers to the family of devices specified by this document. Committee(s): JC-42.4 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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TS5111, TS5110 Serial Bus Thermal Sensor Device Standard |
JESD302-1.01 | Apr 2022 |
This standard defines the specifications of interface parameters, signaling protocols, and features for fifth generation Temperature Sensor (TS5) as used for memory module applications. These device operate on I2C and I3C two-wire serial bus interface. The designation TS5111 and TS5110 refers to the device specified by this document. Item 401.01E. Minor editorial changes listed in Annex A. Committee(s): JC-40.1 Free download. Registration or login required. |
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EXTERNAL VISUAL |
JESD22-B101D | Apr 2022 |
External visual inspection is an examination of the external surfaces, construction, marking, and workmanship of a finished package or component. External visual is a noninvasive and nondestructive test. It is functional for qualification, quality monitoring, and lot acceptance. Committee(s): JC-14.1 Free download. Registration or login required. |
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RECOMMENDED ESD-CDM TARGET LEVELS |
JEP157A | Apr 2022 |
This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make decisions on safe ESD CDM level requirements. Free download. Registration or login required. |
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DDR5 RDIMM Standard Annex ERelease Number: Version 1.0 |
JESD305-R8-RCE | Apr 2022 |
This standard, JESD305-R8-RCE, DDR5 Registered Dual Inline Memory Module with 8-bit ECC (EC8 RDIMM) Raw Card E Annex, defines the design detail of x8, 2 Package Ranks DDR5 RDIMM with 8-bit ECC. The common feature of DDR5 RDIMM, such as the connector pinout, can be found in the JESD305, DDR5 Load Reduced (LRDIMM) and Registered Dual Inline Memory Module (RDIMM) Common Standard. Item 2273.13. Committee(s): JC-45.1 Free download. Registration or login required. |
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DDR5 RDIMM Standard, Annex FRelease Number: Version 1.0 |
JESD305-R4-RCF | Apr 2022 |
This standard, JESD305-R4-RCF, DDR5 Registered Dual Inline Memory Module with 4-bit ECC (EC4 RDIMM) Raw Card F Annex, defines the design detail of x4, 1 Package Rank DDR5 RDIMM with 4-bit ECC. The common feature of DDR5 RDIMM, such as the connector pinout, can be found in the JESD305, DDR5 Load Reduced (LRDIMM) and Registered Dual Inline Memory Module (RDIMM) Common Standard. Item 2273.10. Committee(s): JC-45.1 Free download. Registration or login required. |
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DDR5 RDIMM Standard, Annex CRelease Number: Version 1.0 |
JESD305-R8-RCC | Apr 2022 |
This standard, JESD305-R8-RCC, DDR5 Registered Dual Inline Memory Module with 8-bit ECC (EC8 RDIMM) Raw Card C Annex, defines the design detail of x4, 1 Package Rank DDR5 RDIMM with 8-bit ECC. The common feature of DDR5 RDIMM, such as the connector pinout, can be found in the JESD305, DDR5 Load Reduced (LRDIMM) and Registered Dual Inline Memory Module (RDIMM) Common Standard. Item 2273.12. Committee(s): JC-45.1 Free download. Registration or login required. |
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BYTE ADDRESSABLE ENERGY BACKED INTERFACE |
JESD245E | Apr 2022 |
This standard specifies the host and device interface for a DDR4 NVDIMM-N, which is a DIMM that achieves non-volatility by copying SDRAM contents into non-volatile memory (NVM) when host power is lost using an Energy Source managed by either the module or the host. This standard is used in conjunction with JESD248. Item 2233.54G Committee(s): JC-45.6 Free download. Registration or login required. |
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DDR5 RDIMM Standard Annex DRelease Number: Version 1.0 |
JESD305-R8-RCD | Apr 2022 |
This standard, JESD305-R8-RCD, DDR5 Registered Dual Inline Memory Module with 8-bit ECC (EC8 RDIMM) Raw Card D Annex, defines the design detail of x8, 1 Package Rank DDR5 RDIMM with 8-bit ECC. The common feature of DDR5 RDIMM, such as the connector pinout, can be found in the JESD305, DDR5 Load Reduced (LRDIMM) and Registered Dual Inline Memory Module (RDIMM) Common Standard. Item 2273.03 Committee(s): JC-45.1 Free download. Registration or login required. |
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DDR5 RDIMM Standard Annex BRelease Number: Version 1.0 |
JESD305-R4-RCB | Apr 2022 |
This standard, JESD305-R4-RCB, DDR5 Registered Dual Inline Memory Module with 4-bit ECC (EC4 RDIMM) Raw Card B Annex, defines the design detail of x4, 2 Package Ranks DDR5 RDIMM with 4-bit ECC. The common feature of DDR5 RDIMM, such as the connector pinout, can be found in the JESD305, DDR5 Load Reduced (LRDIMM) and Registered Dual Inline Memory Module (RDIMM) Common Standard. Item 2273.14. Committee(s): JC-45.1 Free download. Registration or login required. |
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DDR5 RDIMM Standard Annex ARelease Number: Version 1.0 |
JESD305-R8-RCA | Mar 2022 |
Item 2273.16 Committee(s): JC-45.1 Free download. Registration or login required. |
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METHOD FOR DEVELOPING ACCELERATION MODELS FOR ELECTRONIC DEVICE FAILURE MECHANISMS |
JESD91B | Mar 2022 |
The method described in this document applies to all reliability mechanisms associated with electronic devices. The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic devices. Committee(s): JC-14.3 Free download. Registration or login required. |
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Annex F, R/C F, in 288-Pin, 1.2 V (VDD), PC4-1600/PC4-1866/PC4-2133/PC4-2400/PC4-2666/PC4-3200 DDR4 SDRAM Registered DIMM Design SpecificationRelease Number: 31 |
MODULE4.20.28.F | Mar 2022 |
This specification defines the electrical and mechanical requirements for Raw Card F, 288-pin, 1.2 Volt (VDD), Registered, Double Data Rate, Synchronous DRAM Dual In-Line Memory Modules (DDR4 SDRAM RDIMMs). These DDR4 Registered DIMMs (RDIMMs) are intended for use as main memory when installed in PCs. Item 2241.11B JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Annex D, Raw Card D, in 260-Pin, 1.2 V (VDD), PC4-1600/PC4-1866/PC4-2133/PC4-2400/PC4-2666/PC4-3200 DDR4 SDRAM SODIMM Design SpecificationRelease Number: 31 |
MODULE4.20.25.D | Mar 2022 |
This specification defines the electrical and mechanical requirements for Raw Card D, 260-pin, 1.2 Volt (VDD), Small Outline, Double Data Rate, Synchronous DRAM Dual In-Line Memory Modules (DDR4 SDRAM SO-DIMMs). These DDR4 SO-DIMMs are intended for use as main memory when installed in PCs, laptops, and other systems. Item 2228.60. Committee(s): JC-45.3 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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TEMPERATURE RANGE AND MEASUREMENTS FOR COMPONENTS AND MODULES |
JESD402-1A | Mar 2022 |
This document specifies standard temperature ranges that may be used, by way of referencing JESD402-1, in other standards, specifications, and datasheets when defining temperature related specifications. Items 1855.13, 1855.16, 1855.22, and 1855.24 Committee(s): JC-42 Free download. Registration or login required. |
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Registration - Plastic Dual Small Outline Surface, 2 Terminal, Wettable Flank Package |
MO-343B | Mar 2022 |
Designator: PDSO-N2-I#-R#x#Z#-CturET0p04 Item: 11.11-1000, Access STP File for MO-343B Cross Reference: DG4.20 Patents(): Nexperia BV: US8809121 B2 Committee(s): JC-11.11 Free download. Registration or login required. |
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Registration - Plastic Dual Small Outline Surface Terminal, Wettable Flank Package |
MO-340C | Mar 2022 |
Designator: PDSO_N#[#]_I#-R#x#Z#-CturET0p04 Patents(): Nexperia BV: 8809121B2 Committee(s): JC-11.11 Free download. Registration or login required. |
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Registration - Plastic Dual Connector |
SO-025B | Mar 2022 |
Designator: PDXC-PP2-I8p9-R107p6xp15Z26p0-DD2p95x1p1 Committee(s): JC-11.14 Free download. Registration or login required. |
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Registration - Enclosure Form Factor for Automotive SSD Connector, Board Mount |
SO-030A | Feb 2022 |
Designator: PBCX-K4_... Cross Reference: MO-348 Committee(s): JC-11.14 Free download. Registration or login required. |
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Registration - 262 Pin DDR5 SODIMM, 0.50 mm Pitch Package |
MO-337B | Feb 2022 |
Designator: PDMA-N262-I0p5-R69p6x3p7Z30p15R2p55x02p35 Item: 11.14-207, Access STP Files for MO-337B Cross Reference: SO-024 Committee(s): JC-11.14 Free download. Registration or login required. |
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Registration - 288 Pin DDR5 DIMM, 0.85 mm Pitch Microelectronic Assembly |
MO-329E | Jan 2022 |
Designator: PDMA-N288-I0p85-R133p8x#p#7Z31p8R2p55x0p6 Patents(): Micron: US7,547,213. Committee(s): JC-11.14 Free download. Registration or login required. |
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DDR5 Load Reduced (LRDIMM) and Registered Dual Inline Memory Module (RDIMM) Common Specification |
JESD305 | Jan 2022 |
This standard defines the electrical and mechanical requirements for 288-pin, 1.1 Volt (VDD and VDDQ), DDR5 Registered (RDIMM) and Load Reduced (LRDIMM), Double Data Rate (DDR), Synchronous DRAM Dual In-Line Memory Modules (DIMM). These 288-pin Registered and Load Reduced DDR5 SDRAM DIMMs are intended for use in server, workstation, and database environments. Item 2273.07. Committee(s): JC-45.1 Free download. Registration or login required. |
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TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN ELECTRONIC DEVICES |
JESD22-A120C | Jan 2022 |
This standard details the procedures for the measurement of characteristic bulk material properties of moisture diffusivity and water solubility in organic materials used in the packaging of electronic devices. These two material properties are important parameters for the effective reliability performance of plastic packaged surface mount devices after exposure to moisture and subjected to high temperature solder reflow. Committee(s): JC-14.1 Free download. Registration or login required. |
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Registration - Enclosure Form Factor for Automotive SSD Connector, Cable Mount |
SO-029A | Jan 2022 |
Designator: PBXC-K4_D#p##-MR36p05x14p5Z10p25-HS Cross Reference: MO-348 Committee(s): JC-11.14 Free download. Registration or login required. |
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Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices |
JEP151A | Jan 2022 |
This test method defines the requirements and procedures for terrestrial destructive* single-event effects (SEE) for example, single-event breakdown (SEB), single-event latch-up (SEL) and single-event gate rupture (SEGR) testing . It is valid when using an accelerator, generating a nucleon beam of either; 1) Mono-energetic protons or mono-energetic neutrons of at least 150 MeV energy, or 2) Neutrons from a spallation spectrum with maximum energy of at least 150 MeV. This test method does not apply to testing that uses beams with particles heavier than protons. *This test method addresses a separate risk than does JESD89 tests for non-destructive SEE due to cosmic radiation effects on terrestrial applications.
Committee(s): JC-14.1 Free download. Registration or login required. |
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SERIAL INTERFACE FOR DATA CONVERTERS |
JESD204C.01 | Jan 2022 |
This is a minor editorial change to JESD204C, the details can be found in Annex A. This standard describes a serialized interface between data converters and logic devices. It contains normative information to enable designers to implement devices that communicate with other devices covered by this document. Informative sections are included to clarify and exemplify the standard. Item 192.02B. Committee(s): JC-16 Free download. Registration or login required. |
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DDR5 Buffer Definition (DDR5DB01) - Rev. 1.1 |
JESD82-521 | Dec 2021 |
This standard defines standard specifications for features and functionality, DC & AC interface parameters and test loading for definition of the DDR5 data buffer for driving DQ and DQS nets on DDR5 LRDIMM applications. The purpose is to provide a standard for the DDR5DB01 (see Note) logic device, for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease of use. Item 323.98K Committee(s): JC-40.4 Free download. Registration or login required. |
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Backup Energy Module Standard for NVDIMM Memory Devices (BEM) |
JESD315 | Dec 2021 |
This standard defines the functional requirements of Backup Energy Module (BEM), henceforth referred to as BEM in this standard. This module shall be used to provide backup power to the Industry Defined Storage Array Controller Cards and NVDIMM-n as applicable. All standards are applicable under all operating conditions unless otherwise stated. Item 2279.03 Committee(s): JC-45 Free download. Registration or login required. |
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Guidelines for Representing Switching Losses of SIC MOSFETs in Datasheets |
JEP187 | Dec 2021 |
This document describes the impact of measurement and/or setup parameters on switching losses of power semiconductor switches; focusing primarily on SiC MOSFET turn-on losses. In terms of turn-off losses, the behavior of SiC MOSFETs is similar to that of existing silicon based power MOSFETs, and as such are adequately represented in typical datasheets. Committee(s): JC-70.2 Free download. Registration or login required. |
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Guideline to Specify a Transient Off-State Withstand Voltage Robustness Indicator in Datasheets for Lateral GaN Power Conversion Devices, Version 1.0 |
JEP186 | Dec 2021 |
This guideline describes different techniques for specifying a Transient Off-state Withstand Voltage Robustness Indicator in datasheets for lateral GaN power conversion devices. This guideline does not convey preferences for any of the specification types presented, nor does the guideline address formatting of datasheets. This guideline does not indicate nor require that the datasheet parameters are used in production tests, nor specify how the values were obtained. Committee(s): JC-70.1 Free download. Registration or login required. |
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Registration - Plastic Bottom Grid Array Ball, 0.35 mm x 0.40 mm Pitch Rectangular Family Package |
MO-350A | Nov 2021 |
Designator: PBGA-B#[#]_I0p35...Item 11-998 Committee(s): JC-11.11 Free download. Registration or login required. |
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SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION |
JESD22-B118A | Nov 2021 |
This inspection method is for product semiconductor wafers and dice prior to assembly. This test method defines the requirements to execute a standardized external visual inspection and is a non-invasive and nondestructive examination that can be used for qualification, quality monitoring, and lot acceptance. Committee(s): JC-14.1 Free download. Registration or login required. |
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DEFINITION OF THE SSTUA32S865 AND SSTUA32D865 28-BIT 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS |
JESD82-19A.01 | Oct 2021 |
This standard defines standard specifications of dc interface parameters, switching parameters, and test loading for definition of the SSTUA32S865 and SSTUA32D865 registered buffer with parity for 2 rank by 4 or similar high-density DDR2 RDIMM applications. This is a minor editor revision as shown in Annex A of the document. Committee(s): JC-40 Free download. Registration or login required. |
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DEFINITION OF THE SSTU32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS |
JESD82-10A.01 | Oct 2021 |
This standard defines standard specifications of dc interface parameters, switching parameters, and test loading for definition of the SSTU32866 registered buffer with parity test for DDR2 RDIMM applications. The purpose is to provide a standard for the SSTU32866 (see Note) logic device, for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease of use. This is a minor editorial revision as shown in Annex A of the document. Free download. Registration or login required. |
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Registration - Shipping and Handling Tray for DDR5 DIMM Microelectronic Assembly |
CO-036B | Oct 2021 |
Designator: N/A Committee(s): JC-11.5 Free download. Registration or login required. |
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REGISTRATION - Battery Cell R/A SMT Type Connector, 1.2 mm Pitch |
SO-028A | Oct 2021 |
Designator: PSXC-L6_I1p2-R11p6x5p85Z2p07-R0p3x0p6ET0p07 Committee(s): JC-11.14 Free download. Registration or login required. |
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REGISTRATION - Battery Cell R/A T/H Type Connector, 1.2 mm Pitch |
SO-026A | Oct 2021 |
Designator: PSXC-P6_I1p2-R11p6x5p85Z2p0-R0p3x0p31H1p16 Committee(s): JC-11.14 Free download. Registration or login required. |
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DEFINITION OF SSTU32865 REGISTERED BUFFER WITH PARITY FOR 2R x 4 DDR2 RDIMM APPLICATIONS |
JESD82-9B.01 | Oct 2021 |
This standard provides the functional definition, ball-out configuration and package outline, signal definitions and input/output characteristics for a 28-bit 1:2 registered driver with parity suitable for use on DDR2 RDIMMs. The SSTU32865 integrates the functional equivalent of two SSTU32864 devices (as defined in JESD82-7) into a single device, thereby easing layout and board design constraints especially on high density RDIMMs such as dual rank, by four configurations. Moreover, the optional use of a parity function is provided for, permitting detection and reporting of parity errors across its 22 data inputs. JESD82-9 specifies a 160-pin Thin-profile, fine-pitch ball-grid array (TFBGA) package. This is a minor editorial revision as shown in Annex A of the document. Free download. Registration or login required. |
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STANDARD FOR DEFINITION OF THE SSTV16859 2.5 V, 13-BIT TO 26-BIT SSTL_2 REGISTERED BUFFER FOR STACKED DDR DIMM APPLICATIONS: |
JESD82-4B.01 | Oct 2021 |
This standard defines standard specifications of dc interface parameters, switching parameters, and test loading for definition of the SSTV16859 13-bit to 26-bit SSTL_2 registered buffer for stacked DDR DIMM applications. The purpose is to provide a standard for the SSTV16859 logic device, for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease of use. This is a minor editorial revision, shown in Annex A of the document. Committee(s): JC-40 Free download. Registration or login required. |
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DEFINITION OF THE SSTUA32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY TEST FOR DDR2 RDIMM APPLICATIONS |
JESD82-16A.01 | Oct 2021 |
This standard defines standard specifications of dc interface parameters, switching parameters, and test loading for definition of the SSTUA32866 registered buffer with parity test for DDR2 RDIMM applications. The purpose is to provide a standard for the SSTUA32866 (see Note) logic device, for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease of use. This is a minor editorial revision as shown in Annex A of the document. Free download. Registration or login required. |
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DEFINITION OF THE SSTUB32868 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS |
JESD82-14A.01 | Oct 2021 |
This standard defines standard specifications of dc interface parameters, switching parameters, and test loading for definition of the SSTUB32868 registered buffer with parity test for DDR2 RDIMM applications. SSTU32S2868 denotes a single-die implementation and SSTU32D868 denotes a dual-die implementation. This is a minor editorial revision as shown in Annex A of the document. Committee(s): JC-40 Free download. Registration or login required. |
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Registration - Battery Cell Wire Side Connector, 1.2 mm pitch |
SO-027A | Sep 2021 |
Designator: PBXC-q6_i1P2-r7P9X4P25z1P58Item: 11.14-199, Access STP Files for SO-027ACross Reference: N/A Committee(s): JC-11.14 Free download. Registration or login required. |
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TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE |
JESD89-3B | Sep 2021 |
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g., flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particle induced SER. Committee(s): JC-14.1 Free download. Registration or login required. |
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