Global Standards for the Microelectronics Industry
Standards & Documents Search
Title |
Document # | Date |
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VOLTAGE REGULATOR DIODE NOISE VOLTAGE MEASUREMENTStatus: Reaffirmed January 1992, April 1999, April 2002 |
JESD307 | May 1965 |
This standard is intended to cover the measurement of noise voltage in voltage regulator diodes in the reverse breakdown region. It describes noise voltage measurements at specified conditions, but may be used as a guide for making such measurements at other than specified conditions. Formerly known as RS-307 and/or EIA-307 Committee(s): JC-22.4 Free download. Registration or login required. |
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VIBRATION, VARIABLE FREQUENCY |
JESD22-B103B.01 | Sep 2016 |
The Vibration, Variable Frequency Test Method is intended to determine the ability of component(s) to withstand moderate to severe vibration as a result of motion produced by transportation or filed operation of electrical equipment. This is a destructive test that is intended for component qualification. This is a minor editorial change to JESD22-B103B, June 2002 (Reaffirmed September 2010). Committee(s): JC-14.1 Free download. Registration or login required. |
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VCSDRAM Specific SDRAM Functions |
SDRAM3.11.5.4 | Jun 1999 |
Release No. 9 Committee(s): JC-42.3 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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USER GUIDELINES FOR QUALITY AND RELIABILITY ASSURANCE OF LSI COMPONENTSStatus: RescindedApr-87 |
JEB17 | Jan 1970 |
USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE: |
JEP138 | Sep 1999 |
The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance. Committee(s): JC-25 Free download. Registration or login required. |
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