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Title	Document #	Date
DRIVER SPECIFICATIONS FOR 1.8 V POWER SUPPLY POINT-TO-POINT DRIVERS	JESD8-17	Nov 2004
This material is intended to be reflected in supplier specifications for point to point DDR devices ranging from 400 Mb/s to 800 Mb/s operation. It is a method to specify driver impedance with something other than a number that does not nec-essarily define how it operates in a real net This standard addresses this issue using net lengths and specifies how much uncertainty can exist in the data for each speed supported. Committee(s): JC-16.1, JC-16 Free download. Registration or login required.
Dual Inline Memory Modules (DIMMs) Table of Contents	MODULE4.20.TOC	Dec 2014
Release No. 24 Committee(s): JC-42.2, JC-42.3 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required.
DYNAMIC ON-RESISTANCE TEST METHOD GUIDELINES FOR GaN HEMT BASED POWER CONVERSION DEVICES, VERSION 1.0 Status: Reaffirmed November 2024	JEP173	Jan 2019
This document is intended for use in the GaN power semiconductor and related power electronic industries, and provides guidelines for measuring the dynamic ON-resistance of GaN power devices. Reaffirmed: November 2024 Committee(s): JC-70, JC-70.1 Free download. Registration or login required.
Dynamic Random Access Memory (DRAM) Table of Contents	DRAM3.9.TOC	Jul 1997
Release No. 9 Committee(s): JC-42, JC-42.3 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required.
EARLY LIFE FAILURE RATE CALCULATION PROCEDURE FOR SEMICONDUCTOR COMPONENTS: Status: Reaffirmed January 2014, September 2019	JESD74A	Feb 2007
This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the ELFR meets customers' requirements. Committee(s): JC-14, JC-14.3 Free download. Registration or login required.

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JEDEC Education Series: Memory, Mobile & Modules