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This standard, JESD318-F0-RCE, “LPDDR5/5X Compression Attached Memory Module (CAMM2) Raw Card E Annex”, defines the design detail of eight x16 subchannels from four 315-ball dual channel LPDDR5/5x devices.

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Committee(s): JC-45

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This standard, JESD323-B4-RCD, “DDR5 Clocked Unbuffered Dual Inline Memory Module with 4-bit ECC (EC4 CUDIMM) Raw Card D Annex” defines the design detail of x8, 1 Package Rank DDR5 ECC CUDIMM with Clock Driver.

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Committee(s): JC-45, JC-45.3

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This standard, JESD323-A0-RCA, “DDR5 Clocked Unbuffered Dual Inline Memory Module (CUDIMM) Raw Card A Annex” defines the design detail of x8, 1 Package Rank DDR5 NECC CUDIMM with Clock Driver.

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Committee(s): JC-45, JC-45.3

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This standard, JESD324-V0-RCC, "DDR5 Clocked Small Outline Dual Inline Memory Module (CSODIMM) RawCard C Annex" defines the design detail of x16, 1 Package Ranks DDR5 CSODIMM with Clock Driver.

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Committee(s): JC-45.3

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This standard defines the Low Power Double Data Rate interface for Non-Volatile Memory (LPDDR4XNVM) Standard. This standard describes features, functionalities, AC and DC characteristics, packages, and ball/signal assignments. The purpose of this specification is to define the minimum set of requirements

for a JEDEC compliant 16 bit single channel LPDDR4X-NVM device. LPDDR4X-NVM density ranges from 128Mb through 32Gb.

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Committee(s): JC-42, JC-42.6

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This standard establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose (objective) of this standard is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels. NOTE Data previously generated with testers meeting all waveform criteria of ANSI/ESD STM5.1-2007 or JESD22A-114F shall be considered valid test data.

Also available JTR-001-01-12: User Guide of ANSI/ESDA/JEDEC JS-001, Human Body Model Testing of Integrated Circuits

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Committee(s): JC-14, JC-14.1

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This standard defines the form, fit and function of SODIMM DDR5 connectors for modules supporting channels with transfer rates 6.4 GT/S and beyond. It contains mechanical, electrical and reliability requirements for a one-piece connector mated to a module with nominal thickness of 1.20 mm. The intent of this document is to provide performance standards to enable connector, system designers and manufacturers to build, qualify and use the SODIMM DDR5 connectors in client and server platforms. Item 14-226

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Committee(s): JC-11, JC-11.14

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This standard defines the overall specifications, interface parameters, signaling protocols, and features for a CXL® Memory Controller ASIC. The standard includes pinout information, functional description, and configuration interface. This standard, along with other Referenced Specifications, should be treated as a whole for the purposes of defining overall functionality for CXL® Memory Controller (referred to as CMC).

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Committee(s): JC-40

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This standard provides a reference specification for systems and device management capabilities found in CXL memory devices. It is intended to target, but may not be limited to, CXL memory FRUs that are based on PCIe Gen 5 and compliant to the CXL 2.0 Specification or later.

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Committee(s): JC-40, JC-45

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