Global Standards for the Microelectronics Industry
Standards & Documents Search
Title | Document # |
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Annex D, Raw Card D, in 260-Pin, 1.2 V (VDD), PC4-1600/PC4-1866/PC4-2133/PC4-2400/PC4-2666/PC4-3200 DDR4 SDRAM SODIMM Design SpecificationRelease Number: 31 |
MODULE4.20.25.D | Mar 2022 |
This specification defines the electrical and mechanical requirements for Raw Card D, 260-pin, 1.2 Volt (VDD), Small Outline, Double Data Rate, Synchronous DRAM Dual In-Line Memory Modules (DDR4 SDRAM SO-DIMMs). These DDR4 SO-DIMMs are intended for use as main memory when installed in PCs, laptops, and other systems. Item 2228.60. Committee(s): JC-45.3 JESD21-C Solid State Memory Documents Main Page Free download. Registration or login required. |
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Registration - Plastic Dual Small Outline Surface, 2 Terminal, Wettable Flank Package |
MO-343B | Mar 2022 |
Designator: PDSO-N2-I#-R#x#Z#-CturET0p04
Item: 11.11-1000, Access STP File for MO-343B
Cross Reference: DG4.20
Patents(): Nexperia BV: US8809121 B2 Committee(s): JC-11.11 Free download. Registration or login required. |
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Registration - Plastic Dual Connector |
SO-025B | Mar 2022 |
Designator: PDXC-PP2-I8p9-R107p6xp15Z26p0-DD2p95x1p1
Item: 11.14-208, Access STP Files for SO-025B Cross Reference: TBD Committee(s): JC-11.14 Free download. Registration or login required. |
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Registration - Enclosure Form Factor for Automotive SSD Connector, Board Mount |
SO-030A | Feb 2022 |
Designator: PBCX-K4_...
Item: 11.14-211,
Access STP Files for SO-030A Cross Reference: MO-348 Committee(s): JC-11.14 Free download. Registration or login required. |
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Registration - 262 Pin DDR5 SODIMM, 0.50 mm Pitch Package |
MO-337B | Feb 2022 |
Designator: PDMA-N262-I0p5-R69p6x3p7Z30p15R2p55x02p35
Item: 11.14-207,
Access STP Files for MO-337B
Cross Reference: SO-024 Committee(s): JC-11.14 Free download. Registration or login required. |
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DDR5 Load Reduced (LRDIMM) and Registered Dual Inline Memory Module (RDIMM) Common Specification |
JESD305 | Jan 2022 |
This standard defines the electrical and mechanical requirements for 288-pin, 1.1 Volt (VDD and VDDQ), DDR5 Registered (RDIMM) and Load Reduced (LRDIMM), Double Data Rate (DDR), Synchronous DRAM Dual In-Line Memory Modules (DIMM). These 288-pin Registered and Load Reduced DDR5 SDRAM DIMMs are intended for use in server, workstation, and database environments. Item 2273.07. Committee(s): JC-45.1 Free download. Registration or login required. |
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TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN ELECTRONIC DEVICES |
JESD22-A120C | Jan 2022 |
This standard details the procedures for the measurement of characteristic bulk material properties of moisture diffusivity and water solubility in organic materials used in the packaging of electronic devices. These two material properties are important parameters for the effective reliability performance of plastic packaged surface mount devices after exposure to moisture and subjected to high temperature solder reflow. Committee(s): JC-14.1 Free download. Registration or login required. |
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Registration - Enclosure Form Factor for Automotive SSD Connector, Cable Mount |
SO-029A | Jan 2022 |
Designator: PBXC-K4_D#p##-MR36p05x14p5Z10p25-HS
Item: 11.14-210, Access STP Files for SO-029A Cross Reference: MO-348 Committee(s): JC-11.14 Free download. Registration or login required. |
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Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices |
JEP151A | Jan 2022 |
This test method defines the requirements and procedures for terrestrial destructive* single-event effects (SEE) for example, single-event breakdown (SEB), single-event latch-up (SEL) and single-event gate rupture (SEGR) testing . It is valid when using an accelerator, generating a nucleon beam of either; 1) Mono-energetic protons or mono-energetic neutrons of at least 150 MeV energy, or 2) Neutrons from a spallation spectrum with maximum energy of at least 150 MeV. This test method does not apply to testing that uses beams with particles heavier than protons. *This test method addresses a separate risk than does JESD89 tests for non-destructive SEE due to cosmic radiation effects on terrestrial applications.
Committee(s): JC-14.1 Free download. Registration or login required. |
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DDR5 Buffer Definition (DDR5DB01) - Rev. 1.1 |
JESD82-521 | Dec 2021 |
This standard defines standard specifications for features and functionality, DC & AC interface parameters and test loading for definition of the DDR5 data buffer for driving DQ and DQS nets on DDR5 LRDIMM applications. The purpose is to provide a standard for the DDR5DB01 (see Note) logic device, for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease of use. Item 323.98K Committee(s): JC-40.4 Free download. Registration or login required. |