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Design Requirements - Wafer Level Ball Grid Arrays (WLBGA).

 DR-4.18A.01 Apr 2021

Item 11.2-965(E)

Committee(s): JC-11, JC-11.2

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A PROCEDURE FOR EXECUTING SWEAT:

Status: Reaffirmed October 2012, September 2018 		JEP119A Aug 2003

This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a separate iterative technique (not provided) to calculate the force current for a given target time to failure. This document does not specify what test structure to use with this procedure. However, users of this algorithm report its effectiveness on both straight-lines and via-terminated test structures. Some test-structures design features are provided in JESD87 and in ASTM 1259M - 96.

Committee(s): JC-14.2

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