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Title Document # Date

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE:

Status: ReaffirmedSeptember 1981, April 1999, October 2002 		JESD6 Feb 1967

This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.

Committee(s): JC-25

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