Global Standards for the Microelectronics Industry
Standards & Documents Search
Displaying 1 - 3 of 3 documents.
| Title | Document # | Date |
|---|---|---|
RECOMMENDED STANDARD FOR THYRISTORS: |
EIA397 | Jun 1972 |
One section of this standard presents a thorough explanation of thyristor principals, defining thedifferent classes of these devices, their Physical structure and detailing the numerous test methods and ratings required in their application to electronic and power circuitry. Another section presents a universally accepted listing of letter symbols. Considerable effort is devoted to the use of JEDEC Type Registration System as related to thyristors. This will permit the device manufacturer to employ a uniform procedure in the development of maximum rating and presentation of performance data. Committee(s): JC-22.1 Free download. Registration or login required. |
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STANDARD TEST PROCEDURE FOR NOISE MARGIN MEASUREMENTS FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITSStatus: Rescinded, October 2008 |
JESD390A | Feb 1981 |
Reaffirmed September 2003 Free download. Registration or login required. |
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DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES:Status: ReaffirmedJanuary 1991, April 1999, April 2002, November 2011 |
JESD4 | Nov 1983 |
This standard defines reference distances between terminals of the device and the external package at specific voltages. Committee(s): JC-22.2 Free download. Registration or login required. |
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