Global Standards for the Microelectronics Industry
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| Title | Document # |
Date |
|---|---|---|
THERMAL SHOCK |
JESD22-A106B.01 | Nov 2016 |
This test is conducted to determine the resistance of a part to sudden exposure to extreme changes in temperature and to the effect of alternate exposures to these extremes. Committee(s): JC-14.1 Free download. Registration or login required. |
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