Global Standards for the Microelectronics Industry
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| Title | Document # | Date |
|---|---|---|
SOLDERABILITYStatus: Rescinded 2014, this document has been replaced by J-STD-002D. |
JESD22-B102E | Oct 2007 |
This test method provides optional conditions for preconditioning and soldering for the purpose of assessing the solderability of device package terminations. It provides procedures for dip & look solderability testing of through hole, axial and surface mount devices and a surface mount process simulation test for surface mount packages. The purpose of this test method is to provide a means of determining the solderability of device package terminations that are intended to be joined to another surface using lead (Pb) containing or Pb-free solder for the attachment. Committee(s): JC-14.1 |
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