Global Standards for the Microelectronics Industry
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TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATEStatus: ReaffirmedJanuary 2012 |
JESD89-3A | Nov 2007 |
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g., flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particle induced SER. Free download. Registration or login required. |