Global Standards for the Microelectronics Industry
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| Title | Document # | Date |
|---|---|---|
TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS: |
JEB15 | Jan 1969 |
This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits. Committee(s): JC-40 |
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