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Title Document # Date

Guidelines for Gate Charge (QG) Test Method for SiC MOSFET

 JEP192 Jan 2023

This publication defines a QGS, TOT, QGD and QGS, TH which can be extracted from a measured QG waveform for SiC MOSFETs.

Committee(s): JC-70, JC-70.2

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Guidelines for Reverse Recovery Time and Charge Measurement of SiC MOSFET Version 1.0

 JEP201 Aug 2024

This guideline is intended to overcome the limitations of prior standards and provide a test circuit and method that provides both reliable and repeatable results.

Committee(s): JC-70, JC-70.2

Free download. Registration or required.

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