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Displaying 1 - 3 of 3 documents.

Title	Document #	Date
TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE	JESD89-2B	Jul 2021
This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flipflops) by measuring the error rate while the device is irradiated by a characterized, solid alph source. Committee(s): JC-14, JC-14.1 Free download. Registration or login required.
TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE	JESD89-3B	Sep 2021
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g., flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particle induced SER. Committee(s): JC-14.1 Free download. Registration or login required.
TEST METHOD FOR REAL-TIME SOFT ERROR RATE	JESD89-1B	Jul 2021
This test is used to determine the Soft Error Rate (SER) of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) for errors which require no more than re-reading or re-writing to correct and as used in terrestrial environments. It simulates the operating condition of the device and is used for qualification, characterization, or reliability monitoring. This test is intended for execution in ambient conditions without the artificial introduction of radiation sources. Committee(s): JC-14, JC-14.1 Free download. Registration or login required.