Global Standards for the Microelectronics Industry
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Title | Document # | Date |
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MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS:Status: ReaffirmedSeptember 1981, April 2000, October 2002 |
JESD25 | Nov 1972 |
This standard provides a test method and definition for small-signal conditions at microwave frequencies. A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-25 Free download. Registration or login required. |