Standards & Documents Search

Displaying 1 - 1 of 1 documents.

Title	Document #	Date
REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION:	JEP121B	Dec 2020
The purpose of this document provides the basis for the optimization of 100% screening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs. A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-13, JC-13.2 Free download. Registration or login required.

Title

Document #

Date

REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION:

JEP121B

Dec 2020

The purpose of this document provides the basis for the optimization of 100% screening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs.

A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office.

Committee(s): JC-13, JC-13.2

Free download. Registration or login required.

Standards & Documents Search

REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION:

Search by Keyword or Document Number

Filter by committees:

Filter by document type:

Filter by keywords: