Global Standards for the Microelectronics Industry
Standards & Documents Search
Displaying 1 - 1 of 1 documents.
| Title | Document # | Date |
|---|---|---|
POWER MOSFET ELECTRICAL DOSE RATE TEST METHOD:Status: ReaffirmedApril 1999 |
JEP115 | Aug 1989 |
The purpose of this Test Method is to establish electrical criteria for comparing and specifying power MOSFET performance under high dose rate radiation. Committee(s): JC-25 Free download. Registration or login required. |
||
